Semiconductor device, physical information acquiring apparatus, and signal reading-out method

ABSTRACT

A semiconductor device includes: an element array portion in which unit elements are disposed in a matrix; and a signal processing portion including a signal processing circuit executing predetermined signal processing based on unit signals outputted from the circuit elements, respectively, every column, in which a function of the signal processing circuit is controlled in such a way that power consumption of the signal processing circuit concerned corresponding to the unit elements each not required becomes lower in a phase of an element selection mode in which only information on a part of the unit pixels for one row in the element array portion is required than in a phase of a normal operation mode.

BACKGROUND

The present disclosure relates to a semiconductor device (including asolid-state imaging device), a physical information acquiring apparatus(including an imaging apparatus), and a signal reading-out method.

A mode in which only information on partial unit elements is required(referred to as “an element selection mode”) such as a thinning-out modein which information on unit elements for each predetermined interval isrequired or a cutting-out mode in which information on unit elements ina specific area is required is known in addition to an all-element modein which information on all of unit elements in an element portionhaving unit elements disposed therein (preferably, an element arrayportion in which unit pixels are disposed in a matrix) (referred to as“a normal mode” as well). In addition, a system for accessing the unitelements for one row at the same time to read-out signals in rows(so-called column reading-out system) when signals are read out from theunit elements of the element array portion in which the unit elementsare disposed in a matrix is used in some cases. When the elementselection mode and the column reading-out system are used together witheach other, this mode is referred to as “a column selection mode.” Forexample, Japanese Patent Laid-Open Nos. 2001-298748 and 2007-142738(hereinafter referred to as Patent Documents 1 and 2) describe thetechniques of the column reading-out system and the column selectionmode.

SUMMARY

However, Patent Document 1 merely describes the technique for inhibitingthe signals from each non-selection column which does not an object ofselection in a phase of the column selection mode from beinghorizontally transferred (skipped). In addition, Patent Document 1merely describes the technique for reducing an operating current foroutput signal lines (vertical signal lines) belonging to eachnon-selection column which does not an object of selection although itdescribes reduction as well of power consumption in a phase of thecolumn selection mode. Moreover, the techniques described in PatentDocuments 1 and 2 are merely applications when horizontal signal lineseach common to all of the columns are used.

The present disclosure has been made in order to solve the problemsdescribed above, and it is therefore firstly desirable to provide atechnique which is capable of more reducing power consumption ascompared with a case of a phase of a normal mode even when an operatingcurrent for output signal lines is not reduced in a phase of a elementselection mode.

It is secondly desirable to provide a technique which is capable ofskipping signals corresponding to unit elements each not required,respectively, in a phase of an element selection mode while aconfiguration is adopted with which horizontal signal lines each commonto all of columns are not used.

It is thirdly desirable to provide a technique which is capable ofskipping signals corresponding to unit elements each not required,respectively, while power consumption is reduced in a phase of anelement selection mode, and which is different from the techniquedescribed in Patent Document 2.

In order to attain the desires described above, according to anembodiment of the present disclosure, there is provided a semiconductordevice including: an element array portion in which unit elements aredisposed in a matrix; and a signal processing portion including a signalprocessing circuit executing predetermined signal processing based onunit signals outputted from the circuit elements, respectively, everycolumn, in which a function of the signal processing circuit iscontrolled in such a way that power consumption of the signal processingcircuit concerned corresponding to the unit elements each not requiredbecomes lower in a phase of an element selection mode in which onlyinformation on a part of the unit pixels for one row in the elementarray portion is required than in a phase of a normal operation mode.

According to another embodiment of the present disclosure, there isprovided a physical information acquiring apparatus including: anelement array portion in which unit elements each including a detectingportion detecting a change in a physical amount, and a unit signalgenerating portion outputting a unit signal through an output signalline based on the change in the physical amount detected by thedetecting portion are disposed in a matrix; and a signal processingportion including a signal processing circuit executing predeterminedsignal processing based on the unit signal acquired under apredetermined detection condition about the physical amount, therebyacquiring physical information for a predetermined object every column,in which a function of the signal processing circuit is controlled insuch a way that power consumption of the signal processing circuitconcerned corresponding to the unit elements each not required becomeslower in a phase of an element selection mode in which only informationon a part of the unit pixels for one row in the element array portion isrequired than in a phase of a normal operation mode.

According to still another embodiment of the present disclosure, thereis provided a signal reading-out method including reading out signalsbased on unit signals by using a device including an element arrayportion in which unit elements are disposed in a matrix, and a signalprocessing portion including a signal processing circuit executingpredetermined signal processing based on unit signals outputted from thecircuit elements, respectively, every column, the signal reading-outmethod including: controlling a function of the signal processingcircuit in such a way that when an element selection mode in which onlyinformation on a part of the unit pixels for one row in the elementarray portion is required is specified, power consumption of the signalprocessing circuit concerned corresponding to the unit elements each notrequired becomes lower than that in a phase of a normal operation mode.

According to yet another embodiment of the present disclosure, there isprovided a semiconductor device including: an element portion in whichunit elements are disposed in a predetermined direction; and atransferring portion holding read-out signals corresponding to unitsignals outputted from said unit elements in memory portions,respectively, and successively transferring the read-out signals held inthe memory portions, respectively, to a subsequent stage, the memoryportions being cascade-connected to one another, in which in a phase ofan element selection mode in which only information on a part of theunit elements in the element portion is required, the read-out signalscorresponding to the unit elements each not required, respectively, areinhibited from being transferred.

According to a further embodiment of the present disclosure, there isprovided a physical information acquiring apparatus including: anelement portion in which unit elements each including a detectingportion detecting a change in a physical amount, and a unit signalgenerating portion outputting a unit signal through an output signalline based on the change in the physical amount detected by thedetecting portion are disposed in a predetermined direction; and atransferring portion holding physical information for a predeterminedobject corresponding to the unit signals outputted from the unitelements in memory portions, respectively, and successively transferringthe physical information held in the memory portions to a subsequentstage, the memory portions being cascade-connected to one another, inwhich in an element selection mode in which only information on a partof said unit elements in the element portion is required, the physicalinformation corresponding to the unit elements each not required,respectively, are inhibited from being transferred.

According to an even further embodiment of the present disclosure, thereis provided a signal reading-out method including reading out signalsbased on unit signals by using a device including an element portion inwhich unit elements are disposed in a predetermined direction, and atransferring portion holding read-out signals corresponding to unitsignals outputted from the unit elements in memory portions,respectively, and successively transferring the read-out signals held inthe memory portions to a subsequent stage, the memory portions beingcascade-connected to one another, the signal reading-out methodincluding: inhibiting the read-out signals corresponding to the unitelements each not required, respectively, from being transferred when anelement selection mode in which only information on a part of the unitelements in the element portion is required is specified.

According to a still further embodiment of the present disclosure, thereis provided a semiconductor device including: an element array portionin which unit elements are disposed in a matrix; a signal processingportion including a signal processing circuit executing predeterminedsignal processing based on unit signals outputted from the unitelements, respectively, and generating read-out signals every column; anoperating current supplying portion including a current source supplyingan operating current with which the unit elements output the unitsignals, respectively, every column; and a transferring portionsuccessively transferring the read-out signals generated by the signalprocessing circuit, in which in a phase of an element selection mode inwhich only information on a part of the unit elements for one row in theelement array portion is required, a function of at least one of saidsignal processing circuit and said current source is controlled in sucha way that power consumption of said at least one of said signalprocessing circuit and said current source corresponding to the unitelements each not required becomes lower than that in a normal operationmode; and the read-out signals corresponding to the unit elements eachnot required, respectively, is inhibited from being transferred.

According to a yet further embodiment of the present disclosure, thereis provided a physical information acquiring apparatus including: anelement array portion in which unit elements each including a detectingportion detecting a change in a physical amount, and a unit signalgenerating portion outputting a unit signal through an output signalline based on the change in the physical amount detected by thedetecting portion are disposed in a matrix; a signal processing portionincluding a signal processing circuit executing predetermined signalprocessing based on the unit signal acquired under a predetermineddetection condition about the physical amount, thereby generatingphysical information for a predetermined object every column; anoperating current supplying portion including a current source supplyingan operating current with which the unit elements output the unitsignals, respectively, every column; and a transferring portionsuccessively transferring the physical information generated by saidsignal processing circuit, in which in a phase of an element selectionmode in which only information on a part of the unit elements for onerow in the element array portion is required, a function of at least oneof the signal processing circuit and said current source is controlledin such a way that power consumption of the at least one of said signalprocessing circuit and the current source corresponding to the unitelements each not required becomes lower than that in a normal operationmode; and the physical information corresponding to the unit elementseach not required, respectively, is inhibited from being transferred.

According to an additional embodiment of the present disclosure, thereis provided a signal reading-out method including reading out signalsbased on unit signals by using a device including an element arrayportion in which unit elements are disposed in a matrix, a signalprocessing portion including a signal processing circuit executingpredetermined signal processing based on unit signals outputted from theunit elements, respectively, and generating read-out signal everycolumn, an operating current supplying portion including a currentsource supplying an operating current with which the unit elementsoutput the unit signals, respectively, every column, and a transferringportion successively transferring the read-out signals generated by thesignal processing circuit, the signal reading-out method including:controlling a function of at least one of the signal processing circuitand said current source in such a way that power consumption of the atleast one of the signal processing circuit and the current sourcecorresponding to the unit elements each not required becomes lower thanthat in a normal operation mode, and inhibiting the read-out signalscorresponding to the unit elements each not required, respectively, frombeing transferred when a phase of an element selection mode in whichonly information on a part of the unit elements for one row in theelement array portion is required is specified.

As set forth hereinabove, according to the present disclosure, in thephase of the element selection mode, even when the operating current forthe output signal lines is not reduced, the signal processing circuitcorresponding to the unit elements each not required is caused to becomethe less power consumption state, whereby the entire power consumptioncan be more reduced than that in the phase of the normal mode.

In addition, according to the present disclosure, the signalscorresponding to the unit elements each not required can be skipped inthe phase of the element selection mode while the configuration isadopted in which the horizontal signal line common to all of the columnsis not used.

Also, according to the present disclosure, in the phase of the elementselection mode, the entire power consumption can be reduced by using thetechnique different from that described in Patent Document 2, and thesignals corresponding to the unit elements each not required can beskipped.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram, partly in circuit, showing a basicconfiguration of a CMOS (Complementary Metal Oxide Semiconductor) typesolid-state imaging device according to an embodiment of the presentdisclosure;

FIG. 2 is a circuit diagram showing a configuration and an operation ofan input stage of a comparing portion shown in FIG. 1;

FIG. 3 is a simple circuit diagram showing a solid-state imaging devicein which attention is paid to AD conversion processing and CDSprocessing;

FIG. 4 is a block diagram showing a schematic configuration of animaging apparatus according to another embodiment of the presentdisclosure using the solid-state imaging device shown in FIG. 1;

FIGS. 5A and 5B are respectively block diagrams explaining a basicconcept of horizontal skipping processing in Comparative Example 1 andExample 1;

FIG. 6 is a diagram explaining a first example of a column stoppingfunction and is also a timing chart at a horizontal scanning rate and animage diagram showing the column stopping function;

FIG. 7 is a block diagram, partly in circuit, explaining a technique forgenerating a column stopping signal in the first example of the columnstopping function;

FIG. 8 is a diagram explaining a second example of the column stoppingfunction and is also a timing chart at a horizontal scanning rate and animage diagram showing the column stopping function;

FIG. 9 is a circuit diagram explaining a technique for generating acutting-out addressing signal in a second example of the column stoppingfunction;

FIG. 10 is a timing chart when a column standby signal is generated;

FIG. 11 is a circuit diagram explaining a first example of a columnstandby signal generating portion;

FIGS. 12A and 12B are respectively circuit diagrams explaining a secondexample of the column standby signal generating portion;

FIGS. 13A and 13B are respectively circuit diagrams showing aconfiguration of a function stop controlling circuit;

FIG. 14 is a timing chart explaining reading-out start position controlfor realizing horizontal scanning skipping processing;

FIG. 15 is a timing chart at a horizontal scanning rate and an imagediagram showing a column stopping function and a horizontal scanningskipping function when the column stopping function and the horizontalscanning skipping function belonging to each non-selection column areused together with each other;

FIG. 16 is a conceptual diagram explaining horizontal scanning skippingprocessing in still another embodiment of the present disclosure;

FIGS. 17A and 17B are respectively a circuit diagram and a timing chartexplaining a technique for generating a reading-out start positionsignal;

FIG. 18 is a diagram explaining a relationship between function stop andcolumn AD conversion processing in each non-selection column;

FIG. 19 is a circuit diagram explaining horizontal skipping processingaccording to Example 1 of the embodiment shown in FIG. 16;

FIG. 20 is a circuit diagram explaining horizontal skipping processingaccording to Example 2 of the embodiment shown in FIG. 16;

FIG. 21 is a circuit diagram explaining horizontal skipping processingaccording to Example 3 of the embodiment shown in FIG. 16;

FIG. 22 is a circuit diagram showing a schematic configuration of ahorizontal transferring portion in Example 4;

FIG. 23 is a circuit diagram (part 1) showing a detailed configurationof a horizontal transferring portion in Example 4;

FIG. 24 is a circuit diagram (part 2) showing a detailed configurationof a horizontal transferring portion of Example 4;

FIG. 25 is a circuit diagram explaining a first case of horizontalskipping processing according to Example 5 of the embodiment shown inFIG. 16;

FIG. 26 is a circuit diagram explaining a second case of horizontalskipping processing according to Example 5 of the embodiment shown inFIG. 16;

FIG. 27 is a circuit diagram explaining a configuration of a horizontaltransferring portion in Example 6; and

FIGS. 28A and 28B are respectively timing charts explaining an operationof the horizontal transferring portion in Example 6.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereinafter, embodiments of the present disclosure disclosed in thisspecification will be described in detail with reference to theaccompanying drawings. When functional elements are distinguished amongembodiments or Examples, the functional elements are described in theform of being giving reference characters of the alphabet such as A, B,C, . . . . On the other hand, when the functional elements are notdistinguished among the embodiments or Examples, the functional elementsare described in the form of omitting the reference characters of thealphabet. This also applies to the drawings.

A description will be given below in accordance with the followingorder:

1. Entire Outline;

2. Solid-State Imaging Device: Basic Configuration and Operation;

3. Imaging Apparatus;

4. Horizontal Skipping Processing; and

5. Concrete Examples of Constitution

Example 1: Cutting-Out Mode, Horizontal Transfer by Shift Register, NoHead Side Skipping

Example 2: Cutting-Out Mode, Horizontal Transfer by Shift Register, HeadSide Skipping

Example 3: Cutting-Out Mode, Horizontal Transfer by Horizontal SignalLine, No Head Side Skipping

Example 4: Cutting-Out Mode, Horizontal Transfer by Horizontal SignalLine, Head Side Skipping

Example 5: Thinning-Out Mode, Horizontal Transfer by Shift Register

Example 6: Thinning-Out Mode, Horizontal Transfer by Horizontal SignalLine.

1. Entire Outline Semiconductor Device, Physical Information AcquiringApparatus, Signal Reading-Out Method

Firstly, basic items will be described below. In a first constitution ofthe present disclosure corresponding to a semiconductor device accordingto a first embodiment of the present disclosure, a physical informationacquiring apparatus according to a second embodiment of the presentdisclosure, and a signal reading-out method according to a thirdembodiment of the present disclosure, when an element selection mode isspecified, a signal processing circuit corresponding to unit elementseach not required in the element selection mode is caused to be a lowpower consumption state. Even when an operating current for an outputsignal line is not reduced, the entire power consumption can be reduced.

Specifically, in the case of the semiconductor device, the semiconductordevice includes an element array portion and a signal processingportion. In this case, unit elements are disposed in a matrix in theelement array portion. Also, the signal processing portion includes asignal processing circuit for executing predetermined signal processingbased on unit signals outputted from the unit elements every column. Inthe case of the physical information acquiring apparatus, the physicalinformation acquiring apparatus includes an element array portion and asignal processing portion. In this case, unit elements each including adetecting portion for detecting a change in a physical amount, and aunit signal generating portion for outputting a unit signal through anoutput signal line based on the change in the physical amount detectedby the detecting portion are disposed in a matrix in the element arrayportion. Also, the signal processing portion includes a signalprocessing circuit for executing predetermined signal processing basedon the unit signals acquired under a predetermined detection conditionabout the physical amount, thereby acquiring physical information for apredetermined object every column. Also, in a phase of an elementselection mode in which only information on a part of the unit elementsfor one row in the element array portion is required, the signalprocessing portion controls a function of the signal processing circuitin such a way that power consumption of the signal processing circuitconcerned corresponding to the unit elements each not required becomeslower than that in a normal operation mode.

“The element selection mode” is a mode in which only a signal from thespecific unit element is required except for an all-element mode inwhich signals from all of the unit elements are read out. With regard toconcrete examples of the element selection mode, a so-calledthinning-out mode in which pixel signals are read out everypredetermined interval column, a cutting-out mode in which a certainarea is partitioned for reading-out, and the like correspond thereto.The thinning-out mode and the cutting-out mode may be used together witheach other. This also applies to each of a second constitution and athird constitution of the present disclosure.

In the first constitution of the present disclosure, when the functionof the signal processing circuit is controlled in such a way that thepower consumption of the signal processing circuit concernedcorresponding to the unit elements each not required becomes lower thanthat in the normal operation mode, any system may be adopted as long asit causes the power consumption state to become the low powerconsumption state. For example, the function of the signal processingcircuit may be controlled in such a way that the power consumption stateis caused to become the low power consumption state with an electricpower being supplied from a power source. Or, a system may also beadopted in which a current from a current source is reduced in afunctional portion having a relationship with the current source. Thefunction of the signal processing circuit may be controlled by stoppingthe supply itself of the electric power from the power source. Theeffect of reduction of the power consumption is higher in the case wherethe supply itself of the electric power from the power source is stoppedthan in the case where the function of the signal processing circuit iscontrolled with the electric power being supplied from the power source.

For the purpose of controlling the function of the signal processingcircuit with the electric power being supplied from the power source,the measures corresponding to a configuration of the signal processingcircuit are taken. For stopping the supply of the electric power fromthe power source, it is only necessary to provide a switch for ON/OFF ofthe supply of the electric power from the power source. In this case, itis better to take measures for preventing an evil influence from beingexerted on an output stage of a circuit in a preceding stage connectedto an input side of each functional portion, or an input stage of acircuit in a subsequent stage connected to an output side of eachfunctional portion. The reason for this is because the circuit in thepreceding stage or the circuit in the subsequent stage is prevented fromcausing a problem such as latch-up due to stop of the supply of theelectric power from the power source. In other words, the technique forcontrolling the function of the signal processing circuit with theelectric power being supplied from the power source can reduce the powerconsumption without worrying about the evil influence such as thelatch-up.

In the first constitution of the present disclosure, although the signalprocessing circuit may adopt a configuration with which analogprocessing is executed, thereby generating an analog read-out signal,preferably, it is only necessary for the signal processing circuit toinclude an Analog to Digital (AD) conversion portion for converting ananalog unit signal into digital data. An anti-noise property is moreadvantageous in the case where a signal is read out as digital data to acircuit in a subsequent stage than in the case where a signal is readout as an analog signal to a circuit in a subsequent stage. Althoughvarious configurations may be adopted for the AD conversion portion,preferably, it is only necessary to adopt a so-called reference signalcomparison type AD conversion portion including a comparison processingportion and a counting processing portion. In this case, the comparisonprocessing portion compares a unit signal with a reference signal whoselevel is gradually changed. Also, the counting processing portioncarries out a counting operation for converting an analog unit signalinto digital data based on the comparison result from the comparisonprocessing portion by using a counting clock for AD conversion. In thiscase, it is only necessary to control the function of the signalprocessing circuit in such a way that the power consumption of any oneof the comparison processing portion and the counting processing portionbecomes lower in the phase of the element selection mode than in thephase of the normal operation mode. Preferably, it is only necessary tocontrol the function of the signal processing circuit in such a way thatthe power consumptions of both of the comparison processing portion andthe counting processing portion become lower in the phase of the elementselection mode than in the phase of the normal operation mode.

In the first constitution of the present disclosure, there may befurther provided an operating current supplying portion including acurrent source for supplying an operating current with which the unitelements output the unit signals, respectively, every column. In thiscase, it is only necessary to set the operating current by the currentsource corresponding to the unit elements each not required less in thephase of the element selection mode than in the phase of the normaloperation mode.

For setting the operating current less in the phase of the elementselection mode than in the phase of the normal operation mode, forexample, it is only necessary to provide a switch capable of switchingan ON state and an OFF state of a current path over to each other,thereby making the operating current zero. Or, current sources may beprovided in output signal lines, respectively, and the current sourcesmay be controlled, thereby directly controlling the current sources ofthe unit elements each not required. In this case, a control amount isadjusted, whereby the current from the current sources of the unitelements each not required can also be made zero, and a small currentless than the current (in other words, of the output signal line of theunit elements each required) in the phase of the normal mode may also bemaintained. When the currents from the current sources of the unitelements each not required are each made zero, it is only necessary toprovide a reference voltage supplying portion for setting an operatingpoint electric potential of the output signal line of the unit elementseach not required at a predetermined value.

In the second constitution of the present disclosure corresponding to asemiconductor device according to a fourth embodiment of the presentdisclosure, a physical information acquiring apparatus according to afifth embodiment of the present disclosure, and a signal reading-outmethod according to a sixth embodiment of the present disclosure, memoryportions are cascade-connected to one another, and a transferringportion is provided. In this case, the transferring portion holdsread-out signals corresponding to unit signals outputted from the unitelements in the memory portions cascade-connected to one another,respectively, and successively transfers the read-out signals held inthe memory portions, respectively, to a subsequent stage. By the way, inthe case of the semiconductor device, the semiconductor device includesan element portion in which unit elements are disposed in apredetermined direction. In the case of the physical informationacquiring apparatus, the physical information acquiring apparatusincludes an element portion. In this case, unit elements each includinga detecting portion for detecting a change in a physical amount, and aunit signal generating portion for outputting a unit signal through anoutput signal based on the change in the physical amount detected by thedetecting portion are disposed in a predetermined direction in theelement portion. Also, in a phase of an element selection mode in whichonly information on a part of the unit elements in the element portionis required, the read-out signals corresponding to the unit elementseach not required, respectively, are inhibited from being transferred.Therefore, although a configuration is adopted in which horizontalsignal lines common to all of the columns, respectively, are not used,it is possible to skip the signals corresponding to the unit elementseach not required, respectively, in the phase of the element selectionmode.

In the cutting-out mode, it is not essential to inhibit both of theread-out signals on a head side and a rear side of transfer out of thecutting-out from being transferred. Thus, it is only necessary toinhibit at least one of the read-out signals on the head side and therear side of the transfer from being transferred. When the read-outsignal on the head side of the transfer is inhibited from beingtransferred, there may be provided a switch for passing (short-cutting)the memory portions inhibited to carry out the transfer.

In the thinning-out mode, it is only necessary to dispose a switchhaving input terminals the number of which corresponds to the number ofthinning-out, and one output terminal between each adjacent two stagesof the memory portion. In this case, output signals from the memoryportions in the preceding stage are inputted to the input terminals inorder. The selection by the switch in the thinning-out mode is carriedout for the output signal from the memory portion which is located inthe preceding stage by the number corresponding to the number ofthinning-out. Or, a switch having two input terminals and one outputterminal is disposed between each adjacent two stages of the memoryportions for each number of thinning-out irrespective of the number ofthinning-out. In this case, an output signal from the memory portionright before the switch is inputted to one input terminal, and an outputsignal from the memory portion which is located in the preceding stageby the number corresponding to the number of thinning-out is inputted toother input terminal. Also, the selection by the switch in thethinning-out mode is carried out for an output signal from the memoryportion which is located in the preceding stage by the numbercorresponding to the number of thinning-out. When the memory portion inthe final stage does not become for the final reading-out from arelationship with the setting of the number of thinning-out, it is onlynecessary to provide a switch for passing (short-cutting) the memoryportions, which are not substantially used, up to the memory portionwhich becomes for the final reading-out to carry out the transfer.

In the second constitution of the present disclosure, the elementportion may be an element array portion in which the unit elements aredisposed in a matrix. In this case, a signal processing portion isfurther provided which includes a signal processing circuit forexecuting predetermined signal processing based on the unit signalsoutputted from the unit elements, respectively, thereby generatingread-out signals every column. Also, in the phase of the elementselection mode, the read-out signals corresponding to the unit elementseach not required are inhibited from being transferred.

In the second constitution of the present disclosure, it is onlynecessary for the signal processing circuit to include an AD conversionportion for converting an analog unit signal into digital data. Theanti-noise property is more advantageous in the case where a signal isread out as digital data to a circuit in a subsequent stage than in thecase where a signal is read out as an analog signal to a circuit in asubsequent stage. Although various configurations can be adopted for theAD conversion portion, preferably, it is better to adopt the so-calledreference signal comparison type AD conversion portion described above.In this case, the transferring portion transfers digital data of theunit signal as the read-out signal.

In a third constitution of the present disclosure corresponding to asemiconductor device according to a seventh embodiment of the presentdisclosure, a physical information acquiring apparatus according to aneighth embodiment of the present disclosure, and a signal reading-outmethod according to a ninth embodiment of the present disclosure, thereis adopted a configuration with which in a phase of an element selectionmode, the entire power consumption can be reduced by using a techniquedifferent from that described in Patent Document 2, and signalscorresponding to unit elements each not required can be skipped. Thebasic way of thinking uses the technique of the first constitution inwhich in the phase of the element selection mode, the power consumptionis caused to be the low power consumption state, and the technique ofthe second constitution in which in the phase of the element selectionmode, the read-out signals corresponding to the unit elements each notrequired are inhibited from being transferred together with each other.However, in the first constitution, the object for which in the phase ofthe element selection mode, the power consumption is caused to be thelow power consumption state is the signal processing circuit, and in thesecond constitution, the transferring portion is used in which thememory portions are cascade-connected to one another. On the other hand,in the third constitution, these limitations are unnecessary. That is tosay, various constitutions can be adopted as long as the function stopof the functional portions corresponding to the non-selection elements,respectively, and the skipping of the signals from the non-selectionelements are used together with each other.

Specifically, in the case of the semiconductor device, the semiconductordevice includes an element array portion, a signal processing portion,an operating current supplying portion, and a transferring portion. Inthis case, unit elements are disposed in a matrix in the element arrayportion. The signal processing portion includes a signal processingcircuit for executing predetermined signal processing based on unitsignals outputted from the unit elements, respectively, therebygenerating read-out signals every column. The operating currentsupplying portion includes a current source for supplying an operatingcurrent with which the unit elements output the unit signals,respectively, every column. Also, the transferring portion successivelytransfers the read-out signals generated by the signal processingcircuit. In the case of the physical information acquiring apparatus,the physical information acquiring apparatus includes an element arrayportion, a signal processing portion, an operating current supplyingportion, and a transferring portion. In this case, unit elements eachincluding a detecting portion for detecting a change in a physicalamount, and a unit signal generating portion for outputting the unitsignal through an output signal line based on the change in the physicalamount detected by the detecting portion are disposed in a matrix in theelement array portion. The signal processing portion includes a signalprocessing circuit for executing predetermined signal processing basedon the unit signals acquired under a predetermined detection conditionabout the physical amount, thereby generating physical information for apredetermined object every column. The operating current supplyingportion includes a current source for supplying an operating currentwith which the unit elements output the unit signals, respectively,every column. Also, the transferring portion successively transfers thephysical information generated by the signal processing circuit. Inaddition, the signal processing portion controls a function of at leastone of the signal processing circuit and the current source in such away that power consumption of the at least one of the signal processingcircuit and the current source becomes lower in a phase of an elementselection mode in which only information on a part of the unit elementsfor one row in the element array portion is required than in a normaloperation mode. Also, the signal processing portion inhibits theread-out signals corresponding to the unit elements each not required,respectively, from being transferred. In the cutting-out mode and thethinning-out mode, with regard to the concrete measures when theread-out signals corresponding to the unit elements each not required,respectively, are inhibited from being transferred, it is only necessaryto adopt the same technique as that in the second constitution.

In the third constitution of the present disclosure, preferably,similarly to the case of the second constitution, it is only necessaryfor the transferring portion to hold the read-out signals correspondingto the unit pixels outputted from the unit elements, respectively, inthe memory portions cascade-connected to one another, and tosuccessively transfer the read-out signals held in the memory portions,respectively, to the subsequent stage. Or, the third constitution of thepresent disclosure is by no means limited thereto, and may adopt anembodiment in which a horizontal signal line common to all of thecolumns is used. That is to say, the transferring portion may have asignal line which is commonly used in the signal processing circuits,and may read out the read-out signals from the signal processingcircuits in order, thereby transferring the read-out signals.

In the third constitution of the present disclosure, when the signalprocessing portion controls the function of at least one of the signalprocessing circuit and the current source in such a way that the powerconsumption of the at least one of the signal processing circuit and thecurrent source corresponding to the unit elements each not requiredbecomes lower in the phase of the element selection mode than in thenormal operation mode, any system may be adopted as long as the systemcauses the power consumption to be the low power consumption state. Forexample, the function of the signal processing circuit may be controlledin such a way that the power consumption state is caused to become thelow power consumption state with an electric power being supplied from apower source. Or, a system may be adopted in which a current from acurrent source is reduced in a functional portion having a relationshipwith the current source. The function of the signal processing circuitmay be controlled by stopping the supply itself of the electric powerfrom the power source. Basically, the technique adopted in the firstconstitution can be similarly applied.

In the third constitution of the present disclosure, it is onlynecessary for the signal processing circuit to include the AD conversionportion for converting an analog unit signal into digital data similarlyto the case of the first constitution. Preferably, it is only necessaryfor the signal processing circuit to adopt the so-called referencesignal comparison type AD conversion portion. In this case, similarly tothe case of the first constitution, it is only necessary to control thefunction of the signal processing circuit in such a way that the powerconsumption of any one of the comparison processing portion and thecounting processing portion becomes lower in the phase of the elementselection mode than in the phase of the normal operation mode.Preferably, it is only necessary to control the function of the signalprocessing circuit in such a way that the power consumptions of both ofthe comparison processing portion and the counting processing portionbecomes lower in the phase of the element selection mode than in thephase of the normal operation mode.

The solid-state imaging device includes an electric charge detectingportion (typically, a photoelectric conversion portion) having asensitivity for an electromagnetic wave, and thus can be applied to animage fetching-in portion for fetching in an image by utilizing theelectric charge detecting portion. Thus, the solid-state imaging deviceis installed and used across the broad of an imaging apparatus and anelectronic apparatus each of which uses the solid-state imaging device.For example, the solid-state imaging device is used in the imagingapparatus (camera system) such as a digital still camera or a videocamera. Also, the electronic apparatuses include a personal digitalassistance, such as a mobile phone, having an imaging function, and acopy machine using the solid-state imaging device or the imagingapparatus in an image fetching-in portion. The solid-state imagingdevice and the imaging apparatus include a linear sensor and an areasensor. The solid-state imaging device can be grasped as one embodimentof a physical amount distribution detecting semiconductor device inwhich plural unit constituent elements (such as pixels) each having thesensitivity for the electromagnetic wave, such as a light or aradiation, which is inputted thereto from the outside are disposedeither in a line or in a matrix. Also, the imaging apparatus can begrasped as one embodiment of a physical information acquiring apparatus(physical amount distribution detecting apparatus) utilizing thephysical amount distribution detecting semiconductor device.

The constitution of the present disclosure can be applied not only tothe solid-state imaging device including the electric charge detectingportion having the sensitivity for the electromagnetic wave, such as thelight or the radiation, which is inputted thereto from the outside, butalso to all of devices which detect changes in various physical amountsas changes in amounts of electric charges. For example, the physicalamount distribution detecting semiconductor device can be applied todevices which detect other physical changes such as a fingerprintauthentication device for detecting information on a fingerprint as animage of a fingerprint based on a change in electrical characteristicsor a change in optical characteristics based on a pressure. For example,the technique of the present disclosure can be applied to a detectingportion in a touch panel. Or, in the field of computer apparatuses, forexample, there is used the fingerprint authentication device fordetecting the information on the fingerprint as the image of thefingerprint based on the change in the electrical characteristics or thechange in the optical characteristics based on the pressure. In thiscase, such a device is a device for reading out a physical amountdistribution which is converted into electrical signals by the unitconstituent elements (the pixels in the case of the solid-state imagingdevice) in the form of the electrical signals, and thus the technique ofthe present disclosure can be applied thereto. A camera module installedin the electronic apparatus is referred to as the imaging apparatus insome cases. Although the constitution which will be described below willbe described by typifying the solid-state imaging device and the imagingapparatus having the solid-state imaging device installed therein, thepresent disclosure is by no means limited thereto, and thus can also beapplied to various electronic apparatuses each having the imagingfunction.

As can be understood from this, not only the techniques described in theappended claims, but also the electronic apparatus including the samefunctional portion as that of the semiconductor device, the solid-stateimaging device, the physical amount distribution detecting semiconductordevice, the imaging apparatus, the physical information acquiringapparatus or the like can be extracted as the technique disclosed inthis specification. By the way, in this specification, the semiconductordevice includes the solid-state imaging device, and the physicalinformation acquiring apparatus includes the imaging apparatus unlessotherwise stated (for example, the point distinctly described here).

2. Solid-State Imaging Device: Basic Configuration and Operation

Hereinafter, a description will be given by exemplifying the case wherea CMOS (Complementary Metal Oxide Semiconductor) type solid-stateimaging device as an example of an X-Y address type solid-state imagingdevice is used as a device. Unless otherwise stated, the descriptionwill be given below on the assumption that in the CMOS type solid-stateimaging device, all of unit pixels are composed of n-channel MOS (nMOS)transistors, and a signal electric charge is a negative electric charge(electron). However, this is merely an example. Thus, the objectivedevice is by no means limited to the MOS type solid-state imagingdevice. That is to say, the unit pixel may be composed of a p-channelMOS (pMOS) transistor, and the signal electric charge may be a positiveelectric charge (hole). All of embodiments which will be described latercan be similarly applied to all of the physical amount distributiondetecting semiconductor devices in each of which plural unit pixels eachhaving the sensitivity for the electromagnetic wave, such as the lightor the radiation, inputted thereto from the outside are disposed eitherin a line or in a matrix, and each of which reads out the signals inaccordance with the address control.

[Basic Configuration]

FIG. 1 is a block diagram, partly in circuit, showing a basicconfiguration of a CMOS type solid-state imaging device (CMOS imagesensor) as an embodiment of the solid-state imaging device. Thesolid-state imaging device is also an example of the semiconductordevice. The solid-state imaging device 1 includes a pixel array portion10 in which plural unit pixels 3 are disposed in a two-dimensionalmatrix. The solid-state imaging device 1, for example, uses a colorseparation filter in which color filters for R, G, and B are arranged ina Bayer arrangement style, whereby the pixel array portion 10 can bemade to respond to the color imaging. Although in FIG. 1, parts of rowsand columns is omitted for the sake of simplicity of illustration,actually, several tens to several thousands of unit pixels 3 aredisposed in each row and in each column. As will be described later, theunit pixel 3 includes an intra-pixel amplifier having three or fourtransistors for electric charge transfer, reset, amplification, and thelike in addition to a photodiode as a light receiving element (electriccharge generating portion) as an example of a detecting portion. For thepixel array portion 10, all it takes is that the unit pixels 3 aredisposed in a two-dimensional form. Thus, the disposition form of theunit pixels 3 is by no means limited to the two-dimensional lattice-likeform, and thus may be a pixel shifting disposition form in which theunit pixels 3 are disposed in an oblique lattice-like form, or may be adisposition form in which the unit pixels 3 are disposed in ahoneycomb-like form.

A pixel signal voltage V_(x) is outputted from the unit pixel 3 everycolumn through a vertical signal line 19. In the pixel signal voltageV_(x) outputted through the vertical signal line 19, a signal levelS_(sig) (received-light signal) appears after a reset level S_(rst)(dark-phase signal) containing therein a noise of a pixel signal as areference level in a time series manner. For example, the reset levelS_(rst) is a level obtained by adding a reset component V_(rst) to afield through level S_(feed). The signal level S_(sig) is a levelobtained by adding a signal component V_(sig) to the reset levelS_(rst), and the signal component V_(sig) is obtained in the form ofS_(sig) (=S_(rst)+V_(sig))−S_(rst). This differential processingcorresponds to so-called Correlated Double Sampling (CDS) processing.Both of the dark-phase signal and the received-light signal are acquiredand difference (level difference) between them is acquired, whichresults in that the noise component is contained in both of thedark-phase signal and the received-light signal in the same way, andthus the noise contained in the difference becomes very small.

One end of the vertical signal line 19 extends to a column portion 26side, and the operating current supplying portion 24 is connected to theextension path, so that an operating current (read-out current) issupplied to the vertical signal line 19. The operating current supplyingportion 24 includes a current source 240 every vertical signal line 19(every column), and includes a reference current source portion 248 usedcommonly in the columns. Here, with regard to a characteristic point ofthis configuration, column stop signals CLMSTP_(n) (details thereof willbe described later) in accordance with which the current sources 240 arecontrolled so as to be turned ON or OFF are inputted to the currentsources 240 so as to correspond to the columns, respectively. Thefunctions of the current sources 240 belonging to each non-selectioncolumn in which the horizontal transfer of the pixel data is unnecessaryare stopped, thereby reducing the power consumption.

In the column portion 26, AD conversion portions 250 each having a CDSprocessing function and a digital conversion function are provided inparallel with one another in columns. In a word, the solid-state imagingdevice 1 is provided with the current source 240 and the AD conversionportion 250 every column. Although details will be descried later, thecolumn portion 26 is provided with a comparing portion 252, a countingoperation time period controlling portion 253, and a counting portion254. The AD conversion portion 250 is configured in the form of a set ofthese functional portions for one column. The wording “parallel with oneanother in columns” means that the functional elements (the ADconversion portions 250 in this case) such as plural CDS processingfunctional portions and plural digital conversion portions (ADconversion portions) are provided in parallel with the vertical signallines 19 (an example of column signal lines) belonging to the respectivevertical columns. We shall refer such a reading-out system as a columnreading-out system. Although in the typical column reading-out system,the vertical signal lines 19 and the AD conversion portions 250 aredisposed so as to show one-to-one correspondence, the present disclosureis by no means limited thereto, and thus may adopt a so-called columnshare configuration in which one AD conversion portion 250 is providedfor predetermined plural columns. In this case, although notillustrated, the column portion 26 is provided with a vertical lineselecting portion for selecting one vertical signal line 19 for thepredetermined plural columns. Adoption of the column sharingconfiguration results in that the comparator and the counter can beshared among plural columns. As a result, there are obtained advantagesthat it is possible to reduce an area which the column portion 26occupies on the sensor chip, the manufacturing cost becomes inexpensive,and so forth.

The solid-state imaging device 1 further includes a drive controllingportion 7, an operation current supplying portion 24, a reference signalgenerating portion 27, and an outputting portion 28. In this case, theoperation current supplying portion 24 supplies an operating current(read-out current) for pixel signal reading to the unit pixel 3. Also,the reference signal generating portion 27 supplies a reference signalSLP_ADC for AD conversion to the column portion 26.

The drive controlling portion 7 includes a horizontal transferringportion 11, a vertical scanning portion 14 (row scanning circuit), and acommunication/timing controlling portion 20 in order to realize acontrol circuit function for successively reading out the signals fromthe pixel array portion 10. In response to a control signal CN2 from thecommunication/timing controlling portion 20, the horizontal transferringportion 11 starts to carry out the scanning for the columns, andtransfers the pixel data acquired in the column portion 26 in thehorizontal direction while it indicates a column portion of the data tobe read out in a phase of a data transferring operation. The verticalscanning portion 14 includes a vertical address setting portion 14 a anda vertical driving portion 14 b which control a row address and rowscanning. The vertical scanning portion 14 selects the row of the pixelarray portion 10 and supplies a pulse necessary for the row thusselected. Thus, the vertical scanning portion 14 starts to carry out thescanning for the rows in response to a control signal CN1 fromcommunication/timing controlling portion 20. The vertical addresssetting portion 14 a selects the row for an electronic shutter, and thelike in addition to the row from which the signals are to be read out(the read-out row: referred to as “a selection row” or “a signal outputrow” as well).

Here, although details will be described later, the features of thehorizontal transferring portion 11 in the embodiment are that thehorizontal transferring portion 11 can execute horizontal partialreading-out processing for horizontally transferring only the pixel dataon a part of the pixels (columns) in the horizontal direction inaddition to the normal reading-out processing for horizontallytransferring the data on all of the pixels in the horizontal direction.

The unit pixel 3 is connected to the vertical scanning portion 14through a row control line 15 for row selection, and is also connectedto the AD conversion portion 250 provided every vertical column of thecolumn portion 26 through the vertical signal line 19. The row controllines 15 shows the entire wirings which are wired from the verticalscanning portion 14 to the pixels.

The communication/timing controlling portion 20 includes a functionalblock of a timing generator (an example of a read address controller).In this case, the functional block of the timing generator supplies aclock synchronized with a master clock CLK0 inputted through a terminal5 a to each of the portions such as the horizontal transferring portion11, the vertical scanning portion 14, and the column portion 26. Inaddition, the communication/timing controlling portion 20 includes afunctional block of a communication interface. In this case, thefunctional block of the communication interface receives the masterclock CLK0 supplied from an external main control portion through theterminal 5 a, receives data which is supplied from the external maincontrol portion through a terminal 5 b and which is used to make aninstruction for an operation mode or the like, and outputs datacontaining therein information on the solid-state imaging device 1 tothe external main control portion. For example, the communication/timingcontrolling portion 20 includes a clock conversion portion 20 a having afunction of a clock conversion portion for generating an internal clock,a system controlling portion 20 b having a communication function and afunction for controlling each of the portions, and the like. The clockconversion portion 20 a includes therein a multiplying circuit forgenerating a pulse having a higher speed frequency than that of themaster clock CLK0 based on the master clock CLK0 inputted through theterminal 5 a. Thus, the clock conversion portion 20 a generates intervalclocks such as a current clock CK_(cntl) and a count clock CK_(dacl).

The outputting portion 28 includes a signal amplifying portion 402(sense amplifier S·A), and a digital interface portion 406 (DIF) makinga function of an interface between the solid-state imaging device 1 andthe outside. The signal amplifying portion 402 detects a signal (havinga small amplitude in spite of digital data) on the horizontal signalline 18 as a signal line (transfer wiring) for data transfer between thehorizontal transfer portion 11 and the signal amplifying portion 402. Inthe outputting portion 28, a digital arithmetically operating portion404 (SIG) for executing various pieces of digital arithmeticallyoperating processing may be provided between the signal amplifyingportion 402 and the digital interface portion 406 as may be necessary.The digital interface portion 406 is interposed between the signalamplifying portion 402 and an external circuit, and makes a function ofan interface with the external circuit. An output terminal of thedigital interface portion 406 is connected to an output terminal 5 c,and video data is outputted to a circuit in a subsequent stage.

[Details of Column AD Circuit and Reference Signal Generating Portion]

With regard to an AD conversion system in the AD conversion portion 250,various systems are considered from a viewpoint of a circuit scale, aprocessing rate (increased processing rate), resolution, and the like.However, as an example, there is adopted an AD conversion system whichis also referred to as a reference signal comparison type AD conversionsystem, a slope integration type AD conversion system, a ramp signalcomparison type AD conversion system or the like. This system has thefeature that even when the AD convertors are provided in parallel withone another, the circuit scale is preventing from being made largebecause the AD convertor can be realized with a simple configuration. Incarrying out the reference signal comparison type AD conversion, acurrent operation enables time period T_(en) is determined based on atime from conversion start (start of the comparison processing) toconversion end (end of the comparison processing) (a signal representingthis time period is referred to as an enable signal EN in this case).Also, a processing object signal is converted into digital data based onthe number of clocks for this time period.

Information obtained from the comparison processing is pulse informationhaving time information corresponding to a magnitude of an analog signal(a pixel signal voltage V_(x) in this case). In the reference signalcomparison type AD conversion processing, an enable time period forcounting processing is determined based on the pulse information (timeinformation) obtained from the comparison processing. Also, there isexecuted counting processing for changing a value at a given rate forthe enable time period for the counting processing. As a typicalexample, the least significant digit is changed one by one with thereference clock cycle by using a counter. The count value thus obtainedis acquired as digital data corresponding to a magnitude of an analogsignal. Of course, all it takes is that the counting processing forchanging the value at the given rate can be executed. Thus, the presentdisclosure is by no means limited to the configuration using thecounter, and various changes can be made. For example, there may beadopted a configuration in which a so-called adder and adder/subtractor,and a data holding portion (latch) for holding therein the result fromthe adder and adder/subtractor with the reference clock cycle are usedto configure a cyclic type AD conversion system, so that a change valuein each of cyclic times is set at the given rate (1 in a typicalexample).

When the reference signal comparison type AD conversion system isadopted, with regard to the way of thinking, it is expected that thereference signal generating portion 27 is also provided every ADconversion portion 250. For example, the case is expected where there isadopted a configuration in which a comparator and a reference signalgenerator are provided every AD conversion portion 250, and a value ofthe reference signal is successively changed by the reference signalgenerator in the corresponding column based on the comparison result ofthe comparator. However, in this case, the circuit scale and the powerconsumption are both increased. Then, the embodiment adopts aconfiguration in which the reference signal generating portion 27 iscommonly used in all of the AD conversion portions 250, therebyobtaining a configuration in which the reference signal SLP_ADCgenerated from the reference signal generating portion 27 is commonlyused by all of the AD conversion portions 250.

For this reason, the reference signal generating portion 27 includes theDigital Analog Conversion (DAC) portion 270. Thus, the reference signalgenerating portion 27 generates the reference signal SLP_ADC having atilt (change rate) represented by control data CN4 synchronously withthe count clock CK_(dacl) from an initial value represented by thecontrol data CN4 from the communication/timing controlling portion 20.The count clock CK_(dacl) may be made identical to the count clockCK_(cntl) for counting processing of the counting portion 254. It isonly necessary for the reference signal SLP_ADC to have a waveform whichis linearly changed with a certain tilt as a whole. Thus, the referencesignal SLP_ADC may have a waveform whose change shows a smoothslope-like shape, or may have a waveform which is successively changedon a step-by-step basis.

In carrying out the reference signal comparison type AD conversion, acount enable time period T_(en) (a signal representing this time periodis referred to as a count enable signal EN) is determined based on theresults of the comparison between the reference signal SLP_ADC and thepixel signal voltage V_(x) by the comparator 252. Also, the analogprocessing object signal is converted into the digital data based on thenumber of clocks of the count clock CK_(cntl) for a time period forwhich the count enable signal EN is held active. Processing about areference level (a reset level S_(rst)) is referred to as processing fora precharge phase (described as “a P phase” as well for short in somecases). Also, processing about a signal level S_(sig) is referred to asprocessing for a data phase (described as “a D phase” as well for shortin some cases). When the processing for the D phase is executed afterthe processing for the P phase, the processing for the D phase becomesprocessing for the signal level S_(sig) obtained by adding the signalcomponent V_(sig) to the reset level S_(rst). With regard to thecounting operation enable time period T_(en), there are a first halfcount system, a second half count system, and a first and second halvescount system. In this case, in the first half count system, for each ofthe P phase and the D phase, the counting is carried out until thecomparison result is inversed. In the second half count system, for eachof the P phase and the D phase, the counting is carried out after thecomparison output has been inversed. Also, in the first and secondhalves count system, for one of the P phase and the D phase, thecounting is carried out until the comparison result is inversed, whilefor the other, the counting is carried out after the comparison outputhas been inversed. In addition, in each of these count systems, thecount modes of the P phase and the D phase are skillfully combined witheach other, or the setting of the initial value in a phase of start ofthe processing for the P phase is controlled, whereby the CDS processingcan also be executed within the column. With regard to how the countingoperation enable time period T_(en) is taken, whether or not thedifferential processing (CDS processing) is executed in the ADconversion portion 250, and so forth, the applicant of this applicationhas proposed variously the reference signal comparison type ADconversion systems. The reference signal comparison type AD conversionsystems thus proposed can also be basically adopted in embodiments whichwill be described later.

In any of the processing examples, in principle, the reference signalSLP_ADC is applied to the voltage comparator, and the analog pixelsignal inputted through the vertical signal line 19 is compared with thereference signal SLP_ADC. When the counting operation enable time periodT_(en) has been entered, the counting based on the clock signal starts,whereby the number of clocks in the counting operation enable timeperiod T_(en) specified is counted, thereby carrying out the ADconversion.

For carrying out the reference signal comparison type AD conversion, theAD conversion portion 250 in each of the columns in the column portion26 in the embodiment includes a comparison processing portion 322 (COMP:a voltage comparing portion or a comparator), a counter control signalgenerating portion 332 (EN generating portion), and a countingprocessing portion 351. In the column portion 26 in the embodiment, thecounting operation time period controlling portion 253 (the countercontrol signal generating portion 332) is disposed between the comparingportion 252 (the comparison processing portion 322) and the countingportion 254 (the counting processing portion 351). Preferably, a counter(up-down counter) which can switch an up-count mode and a down-countmode over to each other is used as the counting processing portion 351.By using the up-down counters, the high frame rate promotion can beattained without increasing the circuit scale. The comparing portion 252is configured in the form of a set of the comparison processing portions322 in the AD conversion portions 250. The counting operation timeperiod controlling portion 253 is configured in the form of a set of thecounter control signal generating portion 322 in the AD conversionportions 250. Also, the counting portion 254 is configured in the formof a set of the counting processing portion 352 in the AD conversionportions 250.

The comparing portion 252 (the comparison processing portion 322)compares the analog pixel signal voltage V_(x) obtained from the unitpixel 3 belonging to the selected row through the vertical signal line19 (H1, H2, . . . , Hn) with the reference signal SLP_ADC generated bythe reference signal generating portion 27 (the DA conversion portion270). The comparison processing portion 322 inverts a comparison pulseC₀ (comparator output) when the analog pixel signal voltage V_(x) agreeswith the reference signal SLP_ADC.

The counter control signal generating portion 332 of the countingoperation time period controlling portion 253 generates a count enablesignal EN based on the comparison output C₀ and the control informationsupplied thereto from the communication/timing controlling portion 20,and supplies the count enable signal EN thus generated to the countingprocessing portion 351, thereby controlling the counting operation timeperiod of the counting processing portion 351. Here, the feature of thisconfiguration is that column stop signals CLMSTP_(n) (details thereofwill be described later) used to control ON/OFF of the countingoperation time period control are inputted to the counter control signalgenerating portion 332 so as to correspond to the columns, respectively.The counting operation time period controlling function of eachnon-selection column for which the horizontal transfer of the pixel datais unnecessary is stopped, thereby reducing the power consumption.

A control signal CN5 for instructing whether or the counting processingportion 351 operates for the counting processing for the P phase/the Dphase in the up-count mode or in a down-count mode, and other pieces ofcontrol information for the setting and resetting processing of theinitial value D_(ini) in the counting processing for the P phase, andthe like is inputted from the communication/timing controlling portion20 to the counting processing portion 351 of each of the AD conversionportions 250.

The reference signal SLP_ADC generated by the reference signalprocessing portion 27 is inputted to one input terminal (+) of thecomparison processing portion 322 in common with input terminals (+) ofother comparison processing portions 322. The vertical signal lines 19belonging to the vertical columns, respectively, are connected to theother input terminals (−) of the comparison processing portions 322,respectively, and the pixel signal voltages V_(x) from the pixel arrayportions 10 are inputted to the other input terminals (−) of thecomparison processing portions 322, respectively. Here, the feature ofthis configuration is that the column stop signals CLMSTP_(n) (thedetails thereof will be described later) each used to control ON/OFF ofthe comparison operation are inputted to the comparison processingportions 322 so as to correspond to the columns, respectively. Thecomparison function for each non-selection column for which thehorizontal transfer of the pixel data is unnecessary is stopped, therebyreducing the power consumption.

The count clock CK_(cntl) is inputted from the communication/timingcontrolling portion 20 to a clock terminal CK of the counting processingportion 351 in common with the clock terminals CK of other countingprocessing portions 351. The counting processing portion 351 has a latchfunction of holding therein the counting results. Here, the feature ofthis configuration is that column stop signals CLMSTP_(n) used tocontrol ON/OFF of the counting operation are inputted to the countingprocessing portions 351 so as to correspond to the columns,respectively. The counting function of each non-selection column forwhich the horizontal transfer of the pixel data is unnecessary isstopped, thereby reducing the power consumption.

Although in the embodiment, the basic configuration is adopted in whichthe CDS processing is executed in (the counting processing portion 351of) the counting portion 254, the present disclosure is by no meanslimited thereto. That is to say, the P phase data on the reset levelS_(rst), and the D phase data on the signal level S_(sig) may betransferred to the outputting portion 28 side separately from eachother, and the CDS processing may be executed in the digitalarithmetically operating portion 404 on the subsequent stage of the ADconversion portion 250.

The solid-state imaging device 1 of the embodiment is configured in theform of so-called one chip (provided on the same semiconductorsubstrate) in which the constituent portions, such as the horizontaltransferring portion 11 and the vertical scanning portion 14, of thedrive controlling portion 7 are formed in a semiconductor area, forexample, made of single crystal silicon integrally with the pixel arrayportion 10 by using the same technique as the semiconductor integratedcircuit manufacturing technique. The solid-state imaging device 1 mayadopt a form in which the constituent portions are formed in thesemiconductor area integrally with one another into one chip. Or, thesolid-state imaging device 1 may also adopt a module-like form which hasan imaging function and into which although an illustration is omittedhere, in addition to various signal processing portions such as thepixel array portion 10, the drive controlling portion 7, and the columnportion 26, optical system portions such as an imaging lens, an opticallow-pass filter, and an infrared ray cutting filter are provided, andare all collectively packaged.

An output side of the individual AD conversion portions 250(specifically, the counting processing portions 351 of the countingportion 254) is connected to the horizontal transferring portion 11.Details of the horizontal transferring portion 11 will be described willbe described later. Note that, for the purpose of making so-calledpipeline horizontal transfer possible, it is possible to adopt aconfiguration including a data memory portion as a memory deviceincluding a latch for holding therein the counting results held in thecounting processing portion 351 in a subsequent stage of the countingprocessing portion 351. The latch holds and stores therein the countingdata outputted from the counting processing portion 351 at a determinedtiming. The pipeline horizontal transfer means processing for executingthe column processing (such as the AD conversion and the CDS processing)in the AD conversion portion 250, and the horizontal transfer of thepixel data in parallel with each other.

[Input Stage of Comparing Portion]

FIG. 2 is a circuit diagram explaining a configuration and an operationof an input stage of the comparing portion 252. The comparing portion252 has the feature that by devising the circuit configuration, acomparison time period is enabled to be set irrespective of a dispersionof a reset component ΔV for each unit pixel 3.

The comparing portion 252 adopts a differential amplifier configurationwhich is generally well known in terms of a basic configuration. Thecomparing portion 252 includes a differential transistor pair portion352, a load transistor pair portion 360, and a current source portion370. Moreover, the feature of this configuration is that the comparingportion 252 includes an operating point resetting portion 380 as well.The differential transistor pair portion 352 includes NMOS typetransistors 353 and 354, and source terminals of the NMOS typetransistors 353 and 354 are connected to each other. An output terminal(a drain terminal of the transistor 354 in the case of FIG. 2) of thedifferential transistor pair portion 352 is connected to a bufferportion (any of a non-inversion type or an inversion type may be valid)having an amplifier function (not shown). Thus, after the sufficientamplification has been carried out for an output signal from thedifferential transistor pair portion 352, the output signal from thedifferential transistor pair portion 352 is outputted as the comparisonpulse C₀.

In the load transistor pair portion 360, PMOS type transistors 362 and364 which are connected so as to become an active load of thedifferential transistor pair portion 352 are disposed on a power sourceside. Specifically, drain terminals of the transistors 353 and 362 areconnected to each other. In addition, drain terminals of the transistors354 and 364 are connected to gate terminals of the transistors 362 and364.

The current source portion 370 supplies a given operating current toeach of the differential transistor pair portion 352 and the loadtransistor pair portion 360, and has a constant current source 372disposed on the grounding (GND) side. In addition, the feature of thisconfiguration is to include a configuration in which “an operatingcurrent caused to flow through the comparison processing portion 322belonging to each non-selection column not requiring the pixel signal isreduced.” Basically, it is possible to adopt the same configuration asthat of the current source 240 in the operating current supplyingportion 24 which will be described later. For example, as shown in FIGS.1 and 2, the current source 240 in each of the columns of the operatingcurrent supplying portion 24 includes an NMOS type switch transistor 374on the current path of the constant current source 372 (between theconstant current source 372, and the source terminals of the transistors353 and 354 in the case of FIG. 2). A DC gate voltage VG_ADC is inputtedto a control input terminal of the constant current source 372 in commonwith the columns. The column stop signals CLMSTP_(n) used to controlON/OFF of the transistor 374 are inputted to gate terminals of theswitch transistors 374 so as to correspond to the columns, respectively.The column stop signals CLMSTP_(n) inputted to the switch transistor 374belonging to each non-selection column for which the horizontal transferof the pixel data is unnecessary becomes an L level to turn OFF theswitch transistor 374, which results in that the function of thecomparing portion 252 is stopped, thereby reducing the powerconsumption.

The operating point resetting portion 380 includes PMOS type switchtransistors 382 and 384. An automatic zero signal AZ is supplied as acomparator resetting signal commonly to each of gate terminals of thePMOS type switch transistors 382 and 384. A timing at which theautomatic zero signal AZ becomes active (the L level in this case) fallswithin a time period for which the pixel signal voltage V_(x) after areset signal RST supplied to the gate terminal of the reset transistorof the unit pixel 3 is changed from the active state to the inactivestate becomes the reset level S_(rst). Or, this timing falls within atime period for which the reset signal RST supplied to the gate terminalof the reset transistor 36 of the unit pixel 3 is held active. For suchtime periods, the reference signal SLP_ADC is at a reset level which isslightly lower than the initial value as a level at which the referencesignal SLP_ADC starts to be changed to a ramp shape.

The pixel signal V_(x) is supplied to the gate terminal (input terminal)of the transistor 353 through a capacitive element 386. Also, thereference signal SLP_ADC is supplied from the reference signalgenerating portion 27 (not shown in FIG. 2) to the gate terminal (inputterminal) of the transistor 354 through a capacitive element 388. Theoperating point resetting portion 380 exhibits a sample and holdfunction for the signals inputted thereto through the capacitiveelements 386 and 388. That is to say, only right before the comparisonbetween the pixel signal V_(x) and the reference signal SLP_ADC starts,the automatic zero signal AZ is made at the active L level, and theoperating point of the differential transistor pair portion 352 is resetat a drain voltage (an operation reference value with which thereference component or the signal component is read out). After that,the pixel signal V_(x) is inputted to the transistor 353 through thecapacitive element 386, and the reference signal SLP_ADC is inputted tothe transistor 354 through the capacitive element 388. Thus, thecomparison processing is continuously executed until the pixel signalV_(x) and the reference signal SLP_ADC becomes the same electricpotential. When the pixel signal V_(x) and the reference signal SLP_ADCbecomes the same electric potential, the output signal is inverted. Atthe outset of start of the comparison processing, the reference signalSLP_ADC is higher than the pixel signal V_(x) and, for example, theoutput signal (the comparison pulse C₀) from the comparing portion 252is at the L level. After that, when the pixel signal V_(x) and thereference signal SLP_ADC are at the same electric potential, the outputsignal from the comparing portion 252 is inverted from the L level tothe H level. The comparison pulse C₀ is supplied to the countingoperation time period controlling portion 253 (not shown).

A reset signal RST (held at the active state) is supplied to the gateterminal of the reset transistor of the unit pixel 3 to reset the resettransistor. At this time, for a time period for which the reset signalRST is held in the active state, a noise pulse having a relatively largevoltage level is generated in the pixel signal voltage V_(x). Afterthat, when the reset signal RST is changed from the active state to theinactive state, the pixel signal voltage V_(x) settles to the resetlevel S_(rst). The level of the noise pulse in the reset active phase,and the subsequent reset level S_(rst) disperse every circuit pixel 3.The signal level S_(sig) corresponding to the signal electric chargesdetected in the electric charge generating portion is superimposed onthe reset level S_(rst), and thus the pixel signal voltage V_(x) appearsas the signal level S_(sig). Therefore, when the reset level S_(rst)disperses, the signal level S_(sig) disperses accordingly. At this time,an influence of the dispersion does not exist in the signal levelS_(sig) itself. In the CDS processing, in view of this point, thedifference between the reset level S_(rst) and the signal level S_(sig)is obtained, thereby acquiring the signal level S_(sig) free from theinfluence of the dispersion.

When the reset level S_(rst) has the dispersion, and thus exceeds thecomparable range of the reference signal SLP_ADC, there may be causedthe possibility that it may be impossible to execute the propercomparison processing. In order to avoid this situation, in the phase ofthe processing of the P phase, the voltage comparing portion 252 isreset at an operation reference value with which the reset level S_(rst)is read out. After that, after the reference signal SLP_ADC has beensupplied to the comparing portion 252, both of the comparing processingand the counting processing start to be executed. That is to say, in thecomparing portion 252, the automatic zero signal AZ is supplied totemporarily connect the gate terminal and the drain terminal of thetransistors 303 and 304 of the differential transistor pair portion 302to each other, thereby configuring diode connection. Also, after anelectric potential obtained by adding the offset component of thetransistor 304 to the electric potential at the input terminal of theamplifying transistor 42 of the unit pixel 3 has been held at the inputterminal (gate terminal) of the transistor 304, the reference signalSLP_ADC is inputted, thereby starting to compare the pixel signal V_(x)with the reference signal SLP_ADC. As a result, since the operatingpoint of the voltage comparing portion 252 is set with the read-outelectric potential of the pixel signal V_(x), the operating pointbecomes hard to receive the influence of the reset level S_(rst).However, when the comparing portion 252 is reset at the operationreference values, generation of a kTC noise is feared. Therefore, in thephase of the processing of the D phase, the reset is not carried out forthe comparing portion 252 (the automatic zero setting is not carriedout), and the reference signal SLP_ADC is immediately supplied to thecomparing portion 252, thereby starting to execute both of the comparingprocessing and the counting processing.

[Basic Operation of Solid-State Imaging Device]

FIG. 3 is a circuit diagram showing a simplified circuit configuration,of the solid-state imaging device 1, in which attention is paid to bothof the AD conversion processing and the CDS processing. The countingoperation time period controlling portion 253 is omitted here.

The unit pixel 3 includes four transistors: a transistor 34 for read andselection; a reset transistor 36; a transistor 40 for verticalselection; and an amplifying transistor 42 as basic elements composingthe pixel signal generating portion 5 in addition to the electric chargegenerating portion 32. The transistor 34 for read and selectioncomposing a transferring portion is driven by using a transfer signalTRG. The reset transistor 36 composing an initializing portion is drivenby using the reset signal RST. Also, the transistor 40 for verticalselection is driven by using the vertical selection signal VSEL.

The electric charge generating portion 32 is an example of the detectingportion composed of a light receiving element such as a photodiode. Inthe electric charge generating portion 32, an anode terminal of thelight receiving element is connected to a reference electric potentialV_(ss) on a low electric potential side, and a cathode terminal sidethereof is connected to a source terminal of the transistor 34 for readand selection. The reference electric potential V_(ss) may be made thegrounding electric potential GND. In the transistor 34 for read andselection (transfer gate), a drain terminal is connected to a connectionnode to which the reset transistor 36, a floating diffusion 38, and theamplifying transistor 42 are all connected. In the reset transistor 36,a source terminal and a drain terminal are connected to the floatingdiffusion 38, and a reset power source V_(rd) (normally, made common tothe power source V_(dd)), respectively.

In the transistor 40 for vertical selection, as an example, a drainterminal and a source terminal are connected to a source terminal of theamplifying transistor 42 and a pixel line 51, respectively. Also, a gateterminal (especially referred to as “a vertical selection gate SELV” isconnected to a vertical selection line 52. In the amplifying transistor42, a gate terminal is connected to the floating diffusion 38, a drainterminal is connected to the power source V_(dd), and a source terminalis connected to the pixel line 51 through the transistor 40 for verticalselection. In addition, the pixel line 51 is connected to the verticalsignal line 19. As another connection example, in the transistor 40 forvertical selection, the drain terminal may be connected to the powersource V_(dd), the source terminal may be connected to the drainterminal of the amplifying transistor 42, and the source terminal of theamplifying transistor 42 may be connected to the pixel line 51.

One end of the vertical line 19 extends to the column portion 26 side,and the operation current supplying portion 24 is connected to theextension path. The current source 240 in each of the columns of theoperating current supplying portion 24 includes the load MOS transistorwith respect to the vertical column. Also, the gate terminals areconnected between the reference current source portion 248 used commonlyin the columns, and the load MOS transistor to configure a currentmirror circuit which in turn functions as a constant current source 242with respect to the vertical signal line 19. Also, there is adopted asource follower configuration with which an approximately constantoperating current (read current) is supplied to the amplifyingtransistor 42.

In addition, the feature of this configuration is to include aconfiguration with which “the current caused to flow through thevertical signal line 19 belonging to each non-selection column notrequiring the pixel signal is reduced.” A mechanism for inhibiting thepixel current in the column not requiring the pixel signal from beingcaused to flow may be provided between the load MOS transistor servingas the current source, and the vertical signal line 19. The powerconsumption can be reduced all the more because this configurationenables the function for reading out the pixel current in the column notrequiring the pixel signal to be inhibited from being perfectlyfulfilled. With regard to “the mechanism for inhibiting the pixelcurrent in the column not requiring the pixel signal from being causedto flow,” for example, it is only necessary to provide a switch sectionfor switching ON/OFF of the current path (switching a conduction stateand a non-conduction state over to each other) such as provision of aswitch, such as a transistor, made from a semiconductor.

Or, the operating current supplying portion 24 may direct control theload MOS transistor serving as the current source connected to thevertical signal line 19 belonging to each non-selection column notrequiring the pixel signal, thereby reducing an amount of current as aconfiguration with which “the current caused to flow through thevertical signal line 19 belonging to each non-selection column notrequiring the pixel signal is reduced.” Even with this configuration,the power consumption can be reduced all the more because thisconfiguration enables the function for reading out the pixel signal ineach column not requiring the pixel signal to be inhibited from beingfulfilled.

When “an amount of current is reduced” with respect to each column notrequiring the pixel signal, it is only necessary to make the currentconcerned smaller than the load current in the phase of the normalreading. Thus, the active state of the load MOS transistor as thecurrent source may be maintained, thereby causing the small current toflow, or the load MOS transistor itself as the current source may bemade to become perfectly an OFF state (non-conduction state), therebyproviding a state in which the current is inhibited from being perfectlycaused to flow. By the way, when the state is provided in which thecurrent is inhibited from being caused to flow through the verticalsignal line 19 belonging to each column not requiring the pixel signal,it is feared that the electric potential of the vertical signal line 19belonging to each column concerned becomes an unstable state and thusthe system becomes unstable in some cases. For solving this problem, itis only necessary to provide a configuration with which the verticalsignal line 19 belonging to each column free from the reading is fixedto a certain electric potential so as to correspond to the provision ofthe state in which the current is inhibited from being caused to flowthrough the vertical signal line 19 belonging to each column notrequiring the pixel signal.

For example, the configuration shown in FIG. 3 includes an NMOS typeswitch transistor 244 on the current path of the constant current source242 (between the constant current source 242 and the vertical signalline 19 in the case of FIG. 3). The column stop signals CLMSTP_(n) usedto control ON/OFF of the switch transistors 244 are inputted to the gateterminals of the switch transistors 244 so as to correspond to thecolumns, respectively. The column stop signals CLMSTP_(n) inputted tothe switch transistor 244 belonging to each non-selection column forwhich the horizontal transfer of the pixel data is unnecessary becomesthe L level to turn OFF the switch transistor 244, which results in thatthe read current supplying function is stopped. The load MOS transistoritself serving as the current source is perfectly made to be the OFFstate (non-conduction state), thereby reducing the power consumption.

The reference signal generating portion 27 includes a DA conversionportion 270 and a resistive portion 340. Although not illustrated, theDA conversion portion 270 includes current source portion configured inthe form of a combination of constant current sources, a counterportion, an offset generating portion, a current source controllingportion, and a reference current source portion for setting a specifiedcurrent I_0, and thus becomes a current output type DA conversioncircuit. The resistive portion 340 having a resistive value R_340 isconnected as a current-to-voltage converting portion to a current outputterminal of the current source portion. The current-to-voltageconverting portion is composed of a current source portion, a currentsource controlling portion, and the resistive portion 340. Also, avoltage generated at a connection point between the current sourceportion and the resistive portion 340 is utilized as a reference signalSLP_ADC.

The vertical signal lines 19 of the columns are connected to oneterminals (inverting input terminals in this case) of the comparisonprocessing portion 322, respectively. As a result, the pixel signalvoltages V_(x) are supplied to the AD conversion portions 250 of thecolumn portion 26 through the vertical signal lines 19, respectively. Inthe AD conversion portion 250, the pixel signal voltage V_(x) read outfrom the unit pixel 3 to the vertical signal line 19 is compared withthe reference signal SLP_ADC in the comparison processing portion 322 ofthe AD conversion portion 250. Also, the counter control signalgenerating portion 332 (not shown) causes the counting processingportion 351 to operate based on the current enable signal EN, andchanges the reference signal electric potential while it showsone-to-one correspondence to the counter operation, thereby convertingthe pixel signal voltage V_(x) of the vertical signal line 19 into thedigital data.

3. Imaging Apparatus

FIG. 4 is a block diagram showing a schematic configuration of animaging apparatus according to another embodiment of the presentdisclosure using the solid-state imaging device 1 according to theembodiment of the present disclosure. This is an embodiment in whichboth of the AD conversion processing, and the horizontal transferringprocessing for the pixel data which are adopted in the solid-stateimaging device 1 described above are applied to the imaging apparatus asan example of the physical information acquiring apparatus. Mainconstituent elements will be described as follows (a description of anyof constituent elements other than the main constituent elements isomitted here).

The imaging apparatus 8 includes an imaging lens 802, an opticallow-pass filter 804, a color filter group 812, the pixel array portion10, the drive controlling portion 7, the column portion 26, thereference signal generating portion 27, and a camera signal processingportion 810. As indicated by a broken line in FIG. 4, an infrared raycutting filter 805 for reducing an infrared ray component can also beprovided in combination with the optical low-pass filter 804. A columnsignal processing portion 810 provided in a subsequent stage of thecolumn portion 26 includes an imaging processing portion 820, and acamera controlling portion 900 functioning as a main control portion forcontrolling the entire imaging apparatus 8. The imaging processingportion 820 includes a signal separating portion 822, a color signalprocessing portion 830, a luminance signal processing portion 840, andan encoder portion 860.

The camera controlling portion 900 includes a microprocessor 902, a ReadOnly Memory (ROM) 904 as a read only memory portion, a Random AccessMemory (RAM) 906, and other peripheral members (not shown). Themicroprocessor 902 is similar to a portion serving as a nerve center ofan electronic computer typified by a Central Processing Unit (CPU) inwhich functions of arithmetic operations and control made by thecomputer are aggregated into an ultra-minute integrated circuit. The RAM906 is an example of a volatile memory portion in/from which writing andreading are possible at any time. The microprocessor 902, the ROM 904,and the RAM 906 are collectively referred to as a microcomputer as well.

The camera controlling portion 900 controls the entire system, and has afunction of adjusting frequencies of the count clocks CK_(cntl) andCK_(dacl), the tilt of the reference signal SLP_ADC, and the like. Acontrol program of the camera controlling portion 900, and the like arestored in the ROM 904. In particular, in this case, a program forcontrolling reference signal comparison type AD conversion processing,horizontal partial reading-out processing, and processing for stoppingthe function of each non-selection column is stored in the ROM 904 bythe camera controlling portion 900. Data with which the cameracontrolling portion 900 executes various pieces of processing, and thelike are stored in the RAM 906. The camera controlling portion 900 isconfigured in such a way that a recording media 924 such as a memorycard is detachable, and is also configured in such a way that connectionto a communication network such as the Internet is possible. Forexample, the camera controlling portion 900 includes a memoryreading-out portion 907 and a communication interface (I/F) 908 inaddition to the microprocessor 902, the ROM 904, and the RAM 906.

The recording media 924, for example, is utilized to register programdata used to cause the microprocessor 902 to execute the softwareprocessing, and a convergence range and exposure control processing(including electronic shutter control) for measured light data DL basedon a luminance system signal from the luminance processing portion 840.In particular, in the embodiment, the recording media 924 is alsoutilized to register various pieces of data such as set values ofvarious pieces of control information used to execute the horizontalpartial reading-out processing and the processing for stopping thefunction of each non-selection column. The memory reading-out portion907 stores (installs) the data read out from the recording media 924 inthe RAM 906. The communication I/F 908 mediates delivery ofcommunication data with the communication network such as the Internet.

In the imaging apparatus 8, both of the data controlling portion 7 andthe column portion 26 are shown in the form of a module separately fromthe pixel array portion 10. However, one chip may also be utilized inwhich the data controlling portion 7 and the column portion 26 areformed together with the pixel array portion 10 on the samesemiconductor substrate integrally with one another. FIG. 4 shows theimaging apparatus 8 in a state of including the optical system composedof the imaging lens 802, the optical low-pass filter 804, the infraredray cutting filter 805, and the like in addition to the pixel arrayportion 10, the drive controlling portion 7, the column portion 26, thereference signal generating portion 27, and the camera signal processingportion 810. This embodiment is suitable when these constituent portionsare collectively packed into the module having the imaging function.Such an imaging apparatus 8, for example, is provided as a camera or anelectronic apparatus, such as a portable apparatus, having the imagingfunction for carrying out “the imaging.” “The imaging” contains not onlythe image shooting in the phase of the normal camera photographing, butalso in a broad sense, the fingerprint detection, or the acquiring ofimage information by utilizing a pressure as a physical amountdistribution in the physical amount distribution detecting semiconductordevice such as a touch panel, or the physical information acquiringapparatus (physical amount distribution detecting apparatus).

In the imaging apparatus 8 as well having such a configuration, byapplying the horizontal partial reading-out processing and theprocessing for stopping the function of each non-selection column whichwill be described later, it is possible to reduce the entire powerconsumption and it is possible to skip the signals corresponding to theunit elements each not required in the phase of the element selectionmode.

4. Horizontal Skipping Processing

Hereinafter, a description will be given with respect to concreteexamples of the horizontal partial reading-out processing (horizontalskipping processing) and a technique related thereto. By the way,Examples 1 to 3 are application examples of the horizontal cutting-outprocessing in a cutting-out mode, and Examples 5 and 6 are applicationexamples of the horizontal thinning-out processing in a thinning-outmode. Although the description will be given below in the case where thethinning-out reading processing in the row direction for skipping thepixel rows with a given cycle, and reading-out the signals from thepixels belonging to the remaining pixel rows, and the cutting-outprocessing in the row direction are used together with each other, thisis not essential to the present disclosure.

FIGS. 5A and 5B are respectively block diagrams explaining a basicconcept of the horizontal skipping processing according to still anotherembodiment of the present disclosure. Specifically, FIG. 5A is a blockdiagram explaining the horizontal skipping processing of ComparativeExample which is contrasted with Example, and FIG. 5B is a block diagramexplaining the horizontal skipping processing of Example.

The horizontal skipping processing in Example 1 is an applicationexample of the horizontal cutting-out processing when the horizontaltransferring portion 11 includes a shift register, and pixel data(read-out signal) is successively shifted to the subsequent stagewhenever a clock for horizontal transfer is inputted, thereby carryingout the horizontal reading (horizontal transfer) of the pixel data.

In a solid-state imaging device 1Z of Comparative Example shown in FIG.5A, a horizontal transferring portion 11Z includes a shift register 510Z(an example of the transferring portion) in which registers 5122 (eachbeing an example of the memory portion) are cascade-connected to oneanother in a given direction. The shift register 510Z is used for thehorizontal transfer itself of the data, and the read-out signal (pixeldata) is successively shifted to the subsequent stage whenever the clockfor the horizontal transfer is inputted. The shift register 510Z holdsthe pixel data (an example of the read-out signals) processed in the ADconversion portions 250 corresponding to the pixel signals outputtedfrom the unit pixels 3, respectively, in the registers 512Z,respectively, and successively transfers the pixel data held in theregisters 512Z to the subsequent stages. The solid-state imaging device1Z includes a horizontal transfer controlling portion 13Z for generatingvarious control signals used to control the shift registers 510Z. Thehorizontal transfer controlling portion 13Z is composed of a gatecircuit and other logic circuits. The solid-state imaging device 1Zreads out all of the pixel data acquired in the AD conversion portions250 of the respective columns in the horizontal direction, including thepixel data of the unnecessary columns (referred to as “the non-selectioncolumns”) out of the cutting-out range (referred to as “the horizontaltransfer” as well), and abandons the unnecessary pixel data of eachnon-selection column in a data processing block (a signal processingportion: for example, a digital arithmetically operating portion 404 ofthe outputting portion 28) in the subsequent stage through theoutputting portion 28. In this case, the power consumption consumed inboth of the current sources 240 and the AD conversion portions 250belonging to each non-selection column becomes equal to that in thephase of the all-pixel reading, and thus there is no merit in terms ofthe power consumption. In addition, a time required for the horizontaltransfer for each non-selection column becomes equal to that in thephase of the all-pixel reading, and thus there is no merit in terms ofthe high speed operation as well.

On the other hand, in a solid-state imaging device 1A of Example shownin FIG. 5B, a horizontal transferring portion 11A includes a shiftregister 510 (an example of the transferring portion) in which registers512A (each being an example of the memory portion) are cascade-connectedin a given direction. The shift register 510A is used for the horizontaltransfer itself of the data, and the read-out signal (pixel data) issuccessively shifted to the subsequent stage whenever the clock for thehorizontal transfer is inputted. The shift register 510A holds the pixeldata (an example of read-out signal) processed in the AD conversionportions 250 corresponding to the pixel signals outputted from the unitpixels 3 in the registers 512A, respectively, and successively transfersthe pixel data held in the registers 512A to the subsequent stages. Thesolid-state imaging device 1A includes a horizontal transfer controllingportion 13A for generating various control signals used to control theshift register 510A. The horizontal transfer controlling portion 13A isalso composed of a gate circuit and other logic circuits. Although theconfiguration itself of the solid-state imaging device 1A appears to bethe same as that of the solid-state imaging device 1Z of ComparativeExample, the configuration itself of the solid-state imaging device 1Ais different from that of the solid-state imaging device 1Z ofComparative Example in detailed configurations and operations of theconstituent functional portions. That is to say, in the solid-stateimaging device 1A of Example, of the data acquired in the AD conversionportions 250 of the respective columns, the data for each non-selectioncolumn is not horizontally transferred, but only the data for thenecessary columns (referred to as “the selection columns”) in thecutting-out range. We shall refer such selective horizontal datareading-out (transferring) processing as horizontal skipping processing(for each non-selection column). As a result, it is possible to reducethe electric power required for the horizontal transfer for eachnon-selection column (it is possible to realize the low powerconsumption), and it is possible to reduce the time required for thehorizontal transfer for each non-selection column. Therefore, it is alsopossible to realize the speeding up of the horizontal transfer.

At this time, preferably, the function concerned is controlled in such away that each non-selection column of the operating current supplyingportion 24 (the current source 240) and the column portion 26 (the ADconversion portion 250) becomes the low power consumption state. Weshall refer this state as that each non-selection column is caused to bea standby state. As a result, it is possible to reduce the electricpower required for the operations of the operating current supplyingportion 24 and the AD conversion portion 250 of each non-selectioncolumn. With regard to the additional effect, since a thermocurrent(dark current) due to power consumption heating is suppressed, the noisein the phase of the pixel data transfer and the data transfer isreduced. In addition, since it is possible to shorten the time requiredfor the horizontal transfer for each selection column by the horizontalskipping of each non-selection column, the speeding up of the horizontalpartial reading-out processing becomes possible. At this time, in theallowable case (details will be described later), one horizontal timeperiod is shortened, thereby making the speeding up of the entireprocessing possible.

Preferably, although it is better to control the function concerned insuch a way that the low power consumption state is obtained with eachnon-selection column of both of the current source 240 and the ADconversion portion 250 as an object, the present disclosure is by nomeans limited thereto. However, each non-selection column of at leastthe AD conversion portion 250 is made an object depending on theconfiguration, and more preferably, each non-selection column of thecurrent source 240 is also made an object. More specifically,preferably, although it is better to control all of the functions of thecurrent source 240 of each non-selection column of the operating currentsupplying portion 24, and the functional portions of the AD conversionportion 250 (the comparison processing portion 322, the counter controlsignal generating portion 332, and the counting processing portion 351)of each non-selection column of the column portion 26, this is notessential to the present disclosure. With regard to the AD conversionportion 250, the function concerned may be controlled in such a way thatat least any one of the functional portions composing the AD conversionportion 250 becomes the low power consumption state.

In “controlling the function concerned,” any system may be adopted aslong as the system has the form allowing the low power consumption stateto be provided. Also, the function concerned may be controlled in such away that the low power consumption state is provided with the electricpower from the power source being supplied. Or, the functional portionhaving a connection with the current source as with the current source240 or the like may adopt a system with which the current of the currentsource is reduced. Or, the function concerned may also be controlled bystopping the supply itself of the electric power from the power source.For “controlling the function concerned with the electric power from thepower source being supplied,” the measures to meet the circuitconfiguration are taken. An example thereof will be described later. In“stopping the supply of the electric power from the power source,”preferably, it is better to take measures for preventing an evilinfluence from being exerted either on the output stage of the circuitin the preceding stage connected to the input side of each of thefunctional portions or on the input stage of the circuit in thesubsequent stage connected to the output side thereof. The effect ofreducing the power consumption is higher in “the stop of the supply ofthe electric power from the power source” than in “the control of thefunction concerned with the electric power from the power source beingsupplied.” For example, if the increasing circuit scale is permitted, apower switch is located on the columns skipped, thereby making itpossible to more reduce the power consumption.

Operation Stopping Control for Each Non-Selection Column First Example

FIGS. 6 and 7 are respectively diagrams explaining a first example of afunction (column stopping function) of stopping the column circuit ofeach non-selection column in the phase of the horizontal cutting-out.Here, FIG. 6 is a timing chart at a horizontal scanning rate and animage diagram showing the column stopping function. Specifically, animage diagram of timing charts of a horizontal synchronous signal,timings of the cutting-out start and cutting-out end of the transferdata, a column stop signal, and corresponding pixel cut-out portion isshown in FIG. 6. Also, FIG. 7 is a block diagram, partly in circuit,explaining a technique for generating the column stop signal in thefirst example of the column stopping function.

The feature of the column stopping function of the first example is thateach of control signals representing a start position and an endposition of the cut-out portion are represented in the form of an L/Hlogic. By the way, “L” represents a low level, and “H” represents a highlevel. The description will be continuously given with reference to theconfiguration as well of the solid-state imaging device 1A of Exampleshown in FIG. 5B. A control signal used to stop the column circuit ineach non-selection column in the phase of the horizontal cutting-out isgenerated in a horizontal transfer controlling portion 13A_1, therebystopping the operation of the column circuit, of each non-selectioncolumn, for generating the pixel data (gray portion) not used in thehorizontal direction. Both of a control signal (cutting-out startsetting signal) indicating a start position of the cut-out portion, anda control signal (cutting-out end setting signal) indicating an endposition of the cut-out portion are supplied from thecommunication/timing controlling portion 20 to the horizontal transfercontrolling portion 13A_1. For example, as shown in FIG. 6, for a timeperiod ranging from the start point of the horizontal synchronous signal(at the active L level) to the start position of the cut-out portion,the cutting-out start setting signal is held at the active H level, andfor other time periods, the cutting-out start setting signal is held atthe inactive L level. For a time period from the end position of thecut-out portion to the start position of the horizontal blanking timeperiod, the cutting-out end setting signal is held at the active Hlevel, and for other time periods, the cutting-out end setting signal isheld at the inactive L level. The start position and the end position ofthe cut-out portion, for example, can be set by the registers or thelike. The cut-out range may not be specified by hand-coded setting, butthe arbitrary cut-out range can be specified. The timings and logics ofthe cutting-out start setting signal and the cutting-out end settingsignal are by no means limited to those shown in FIG. 6.

The horizontal transfer controlling portion 13A_1 to which the firstexample is applied, as shown in FIG. 7, includes one 2-input type ORgate 522 and latch portions 524 for the number of columns. Both of thecutting-out start setting signal and the cutting-out end setting signalare supplied to an input terminal of the OR gate 522. The OR gate 522obtains a logical sum of the cutting-out start setting signal and thecutting-out end setting signal, generates the column stop signal, andsupplies the column stop signal to each of the latch portions 524 forthe respective columns. Signals (for example, horizontal readcontrolling pules HSEL_(n)) used to output a trigger while thehorizontal transfer is carried out every pixel are supplied to latchtiming control input terminals of the latch portions 524, respectively.For example, for generating the column stop signal, for one line duringthe reading time period of the vertical blanking, the pixel signals areread out from all of the pixels as well (the cut-out pixels+the pixelsother than the cut-out portion). At this time, the latch portions 524individually fetch in the column stop signals outputted from the OR gate522 synchronously with the horizontal read control pulses HSEL_(n),store therein values as physical values, and latch (hold) therein thevalues until the reading for all of the pixels is ended. Signals of thephysical values latched by the respective latch portions 524 arereferred to as “a column standby signals.”

Operation Stopping Control for Each Non-Selection Column Second Example

FIGS. 8 and 9 are respectively diagrams explaining a second example of afunction (column stopping function) of stopping the column circuit ofeach non-selection column in the phase of the horizontal cutting-out.Here, FIG. 8, similarly to the case of FIG. 6, is a timing chart at ahorizontal scanning rate and an image diagram showing the columnstopping function. Specifically, an image diagram of timing charts of ahorizontal synchronous signal, timings of the cutting-out start andcutting-out end of the transfer data, a column stop signal, andcorresponding pixel cut-out portion is shown in FIG. 8. Also, FIG. 9 isa block diagram, partly in circuit, explaining a technique forgenerating the cutting-out addressing signal in the second example ofthe column stopping function.

The feature of the column stopping function of the second example isthat horizontal address information is added by using the concept of theaddress, thereby creating control signals (such as the cutting-outaddressing signal) representing the start position and end position ofthe cut-out portion from signals specifying addresses of the pixels inthe horizontal direction. A horizontal address signal, an address signal(a cutting-out start address setting signal) representing the startposition of the cut-out portion, and an address signal (cutting-out endaddress setting signal) representing the end position of the cut-outportion are all supplied from the communication/timing controllingportion 20 to a horizontal transfer controlling portion 13A_2 to whichthe second example is applied.

The horizontal transfer controlling portion 13A_2, as shown in FIG. 9,includes digital comparators 532 and 534, and an RS latch 538 (RS typeflip flop). Each of the digital comparators 532 and 534 includes 2-inputtype AND gates 536 for the number of bits, and an AND gate 537 havinginput terminals for the number of bits. In each of the AND gates 536 bythe bits of the digital comparator 532, bit data to which the addressingsignal corresponds is supplied to one input terminal, and bit data towhich the cutting-out start address setting signal corresponds to theother input terminals. In each of the AND gates 536 by the bits of thedigital comparator 534, bit data to which the addressing signalcorresponds is supplied to one input terminal, and bit data to which thecutting-out end address setting signal corresponds to the other inputterminals. In any of the digital comparators 532 and 534, output signalsfrom the respective AND gates 536 are supplied to the respective inputterminals of the AND gate 537. When all of the output signals from therespective AND gates 536 are held at the H level in logic, an outputsignal from the AND gate 537 becomes the H level in logic. A horizontalsynchronous signal (at the active L level) is supplied to a presetterminal of the RS latch 538. An output terminal of the digitalcomparator 532 is connected to a reset input terminal R of the RS latch538, and an output terminal of the digital comparator 534 is connectedto a set input terminal S of the RS latch 538.

When the signal at the reset input terminal R becomes the H level whilethe signal at the set input terminal S is at the L level, the RS latch538 is reset and thus a signal at a non-inverting input terminal becomesthe L level. When the signal at the set input terminal S becomes the Hlevel while the signal at the reset input terminal R is at the L level,the RS latch 538 is reset and thus the signal at the non-inverting inputterminal becomes the H level. For example, in a phase of signalprocessing for one line, firstly, the RS latch 538 is preset by usingthe horizontal synchronous signal (at the active L level), and thus thesignal at the non-inverting input terminal becomes the H level. Afterthat, when (the address data represented by) the addressing signal ischanged in order depending on the pixel position for the horizontaltransfer, and agrees with the cutting-out start address setting signal,all of the output signals from the respective AND gates 536 of thedigital comparator 532 become the H level. Therefore, the signal at theoutput terminal of the AND gate 537 (in a word, the reset input terminalR of the RS latch 538) becomes the H level to reset the RS latch 538,and thus the signal at the non-inverting output terminal becomes the Llevel. After that, when (the address data represented by) the addressingsignal is more changed depending on the pixel position for thehorizontal transfer, and agrees with the cutting-out end address settingsignal, all of the output signals from the respective AND gates 536 ofthe digital comparator 534 become the H level. Therefore, the signal atthe output terminal of the AND gate 537 (in a word, the set inputterminal S of the RS latch 538) becomes the H level to reset the RSlatch 538, and thus the signal at the non-inverting output terminalbecomes the H level. As a result, as shown in FIG. 8, the cutting-outaddressing signal is outputted at the same timing as that of the columnstop signal from the non-inverting output terminal Q of the RS latch538.

As described above, when the address of the pixel to be cut out is clearas with the technique of the second example, it becomes unnecessary togenerate the column stop signal. In other words, although in the firstexample, the column ADC for the pixels other than those in the cut-outportion needs to be carried out at least for one horizontal scanningtime period during the vertical blanking time period, there is not suchnecessity in the second example. However, as can be understood from theconsumption between FIG. 7 and FIG. 9, the circuit scale becomes largerin the horizontal transfer controlling portion 13A_2 of the secondexample than in the horizontal transfer controlling portion 13A_1 of thefirst example. Thus, the second example can be adopted when the increasein the circuit scale is permitted.

[Generation of Standby Signal]

FIG. 10 to FIGS. 12A and 12B are respectively a timing chart and circuitdiagrams explaining a technique for generating the column standbysignal. Here, FIG. 10 is a timing chart when a column standby signal isgenerated. FIG. 11 is a circuit diagram explaining a first example ofthe column standby signal generating portion. Also, FIGS. 12A and 12Bare respectively circuit diagrams explaining a second example of thecolumn standby signal generating portion.

Here, a description will be given with respect to a technique forgenerating the column standby signal based on the column stop signalwhich is generated by applying the operation stop control for eachnon-selection column of the first example shown in FIGS. 6 and 7. Forthis reason, FIG. 10 shows the timing chart showing an example in whichthe column standby signal is created from the column stop signal. Whenthe operation stop control for each non-selection column of the secondexample shown in FIGS. 8 and 9 is applied, it is only necessary to usethe cutting-out addressing signal instead of using the column stopsignal of the first example.

A logic is obtained between the signal (for example, the horizontal readcontrol pulse HSEL_(n)) used to output a trigger when the horizontaltransfer is carried out every pixel, and the column stop signal CLMSTPgenerated in the phase of the reading processing for the verticalblanking time period. Also, there is generated a column standby signalCLMSTB_(n) for each column which enables the current source 240 _(n) ofthe operating current supplying portion 24, and the AD conversionportion 250 _(n) of the column portion 26 to become the standby state.With regard to the horizontal read control pulse HSEL, it is onlynecessary to refer to Example 3 which will be described later. Forexample, while the column stop signal CLMSTP is at the H level, thelogic is obtained with the pulse of the horizontal read control pulseHSEL_(n) to make the column standby signal CLMSTB_(n) at the H level,thereby making both of the current source 240 _(n) and the AD conversionportion 250 _(n) in the standby state. On the other hand, while thecolumn stop signal CLMSTP is at the L level, even when the logic isobtained with the pulse of the horizontal read control pulse HSEL_(n),the column standby signal CLMSTB_(n) is made at the L level to outputthe pixel data without making both of the current source 240 _(n) andthe AD conversion portion 250 _(n) in the standby state. In accordancewith this control, both of the current source 240 _(n) and the ADconversion portion 250 _(n) can be operated in the cut-out portion (eachselection column) of the pixels, and the functions of both of thecurrent source 240 _(n) and the AD conversion portion 250 _(n) can becontrolled in a portion (each non-selection column) other than thecut-out portion of the pixels. When the functions of both of the currentsource 240 _(n) and the AD conversion portion 250 _(n) of eachnon-selection column are controlled, the column ADC processing is notexecuted in the portion other than the cut-out portion, which cancontribute to the low power consumption promotion.

The logic is obtained between the horizontal read control pulse HSEL_(n)used to output the trigger when the horizontal transfer is carried outevery pixel, and the column stop signal CLMSTP, thereby generating thecolumn standby signal used to make the column(s) in the standby state.For example, while the column stop signal CLMSTP is at the active Hlevel, the logic is obtained with the horizontal read control pulseHSEL_(n) to make the column standby signal CLMSTB_(n) at the active Hlevel (in the standby state of the column(s)). On the other hand, whilethe column stop signal CLMSTP is at the inactive L level, even when thelogic is obtained with the horizontal read control pulse HSEL_(n), thecolumn standby signal is made to be held in the inactive L level (thecolumn(s) is(are) prevented from becoming the standby state). Forexample, FIG. 11 shows a configuration of the column standby signalgenerating portion 550A (corresponding to the latch portion 524 when itis made to correspond to FIG. 7) of a first example included in thehorizontal transfer controlling portion 13A. The column standby signalgenerating portion 550A of the first example has the configuration offetching in and holding the column stop signal CLMSTP only when thehorizontal read control pulse HSEL_(n) is inputted thereto.Specifically, the column standby signal generating portion 550A includesa 2-input type selector 552, and a D type flip flop 554 every column (ina word, every column portion 23). In the selector 552, the column stopsignal CLMSTP outputted from the OR gate 522 shown in FIG. 7 is inputtedto one input terminal (a “1” side), and a non-inverted output signal Qfrom the flip flop 554 is inputted to the other input terminal (a “0”side). The horizontal read control pulse HSEL_(n) is supplied to acontrol input terminal of the selector 552. In each of the flip flops554, an output signal from the selector 552 is inputted to a data inputterminal D, and a clock for horizontal transfer (a horizontal transferclock CK_H) is supplied to a clock input terminal. In a phase of startof the operation (for example, in a phase of start of the verticalscanning), a reset signal is supplied to a reset terminal RST of theflip flop 554 to reset the non-inverted output signal Q.

With such a configuration, while the horizontal read control pulseHSEL_(n) is active (at the “1” (H) level in this case), the selector 552selects and outputs the column stop signal CLMSTP as the input signal onthe “1” side. On the other hand, while the horizontal read control pulseHSEL_(n) is inactive (at the “0” (L) level in this case), the selector552 selects and outputs the column stop signal CLMSTP as the inputsignal on the “0” side. Since the signal thus selected and outputted isfetched in by the flip flop 554, when the column stop signal CLMSTP atthe H level (representing the columns out of the cut-out range) istemporarily fetched in, the H level can be maintained. As a result, thecolumn standby signal CLMSTB_(n) as shown in FIG. 10 is outputted fromthe non-inverting output terminal Q of the flip flop 554.

FIGS. 12A and 12B show a configuration of a column standby signalgenerating portion 550B of a second example includes in the horizontaltransfer controlling portion 13A. As shown in FIG. 12A, the columnstandby signal generating portion 550B of the second example includes ashift register 560 (an example of the transferring portion) in whichregisters 562 (each being an example of the memory portion) arecascade-connected to one another, and a stop determining portion 566.The register 562 and the shift register 560 correspond to a register 662and a shift register 660 in Example 3 which will be described later,respectively. In this case, a detailed description thereof is omittedfor the sake of simplicity. The shift register 660 carries out a shiftoperation for successively supplying the horizontal read control pulseHSEL_(n) to the register 562 in the subsequent stage along with thehorizontal scanning.

As shown in FIG. 12B, the stop determining portion 566 includes a D typelatch 568 (D type flip flop) every column. The column stop signal CLMSTPis supplied to a data input terminal D of the D type latch 568 in commonwith the columns. A horizontal read control pulse HSEL_(n) of thecorresponding column is supplied to the clock input terminal CK of the Dtype latch 568. The D type latch 568 fetches in and holds the value(either L or H) of the column stop signal CLMSTP at a rising edge of thehorizontal read control pulse HSEL_(n), thereby outputting the columnstandby signal CLMSTB_(n) to the non-inverting output terminal Q. Thus,the D type latch 568 supplies the column standby signal CLMSTB_(n) toeach of the current source 240 and the AD conversion portion 250 of thecorresponding column. As a result, as shown in FIG. 10, the columnstandby signal CLMSTB_(n) of each non-selection column out of thecut-out range is at the H level, and the column standby signalCLMSTB_(n) of each non-selection column within the cut-out range is atthe L level. By the way, the horizontal read control pulse HSEL_(n)supplied to the AD conversion portion 250, for example, is utilized forselecting the AD conversion portion 250 becoming an object of thereading of the pixel data.

[Function Stop Controlling Circuit]

FIG. 13 is a block diagram, partly in circuit, showing a configurationof a function stop controlling circuit for turning ON or OFF thefunctions of the current sources 240 _(n) of the operating currentsupplying portion 24, and the AD conversion portions 250 _(n) of thecolumn portion 26 by using the column standby signals CLMSTB_(n)generated so as to correspond to the columns, respectively, incorrespondence to the columns, respectively. As also described withreference to FIGS. 1, 2, and 3, the column stop signals CLMSTP_(n) usedto control ON/OFF of the functions are inputted to the switchtransistors 244 of the current sources 240, the switch transistors 374of the comparing portion 252, the counter control generating portions332, and the counting transferring portions 351 so as to correspond tothe columns, respectively. It is only necessary for the column stopsignal CLMSTP_(n) to invert the logic of the column standby signalCLMSTB_(n) by the inverter 572 to generate the column standby signalCLMSTB_(n) thus inverted in logic. As shown in FIG. 2, the function stopcontrolling circuit for controlling the function of the current source240 _(n) can be realized in the form of the configuration in which theswitch transistor 244 is provided in the constant current source 242,and the current supply is suppressed by (the L level of) the columnsignal CLMSTP_(n). As shown in FIG. 3, the function stop controllingcircuit for controlling the function of the comparison processingportion 322, can be realized in the form of the configuration in whichthe switch transistor 374 is provided in the constant current source372, and the current supply is suppressed by (the L level of) the columnstop signal CLMSTP_(n). As shown in FIG. 13B, the function stopcontrolling circuit for controlling the function of the countingprocessing portion 351 _(n) is realized in the form of the configurationin which the logical product of the column stop signal CLMSTP_(n) andthe count clock CK_(cntl) is obtained in the AND gate 576, and the clock(having the same logic as that of the count clock CK_(cntl)) supplied tothe clock input terminal CK of the up-down counter 578 of the countingprocessing portion 351 is stopped. Or, although not illustrated, theremay also be adopted a configuration in which the logic is obtained withthe count enable signal EN within the up-down counter 578, and the clocksupply is stopped. The configuration is adopted in which normally, thecounting is carried out only when the count enable signal EN is active,and the logic is obtained with the column stop signal, thereby carryingout the control in such a way that the count enable signal EN does notbecome active. Although not illustrated, all it takes is that thefunction stop controlling circuit for controlling the function of thecounter control signal generating portion 332 is a circuit forcontrolling the function concerned for generating the count enablesignal EN. Thus, it is only necessary to adopt a configurationcorresponding to the configuration of the counter control signalgenerating portion 332. As described above, the stopping of functions ofthe current source 240 and the AD conversion portion 250 belonging toeach non-selection column for which the horizontal transfer for thepixel data is unnecessary leads to the reduction of the powerconsumption.

[Horizontal Scanning Skipping Processing]

FIGS. 14 and 15 are respectively a diagram and a timing chart explainingprocessing for inhibiting the horizontal transfer for the pixel data ofeach non-selection column out of the cut-out range from being executed(for inhibiting the transfer of the read-out signal), in a word,processing for skipping the pixel data of each non-selection column inthe horizontal transfer (referred to as “horizontal scanning skippingprocessing”). Here, FIG. 14 is a diagram explaining read start positioncontrol for realizing the horizontal scanning skipping processing. Also,FIG. 15 is a timing chart at the horizontal scanning rate and an imagediagram of the column stop function and the horizontal scanning skippingprocessing when the column stop function and the horizontal scanningskipping processing for each non-selection column are used together witheach other.

In FIG. 14, a pulse indicated by a broken line is a pulse when noskipping is carried out, and a pulse indicated by a solid line is apulse when the horizontal scanning skipping processing is executed bycarrying out the control for the horizontal read control pulse HSEL.When the reading of the pixels (the horizontal transfer for the pixeldata) is carried out, the horizontal read control pulse HSEL isoutputted with one pixel as a unit, thereby carrying out the control forthe pixel reading timing. At this time, the control for the skipping ofthe horizontal read control pulse HSEL for the horizontal scanningskipping processing is realized by starting the first output of thehorizontal read control pulse HSEL from the pixel bit corresponding tothe cutting-out start. As a result, as shown in FIG. 15, the pixel datain and before the cutting-out start can be skipped (prevented from beingread out).

[Reading-Out Start Position Control]

FIG. 16 is a conceptual diagram explaining the horizontal scanningskipping processing according to still another embodiment of the presentdisclosure. As shown in FIG. 16, when the reading-out start position isset, the pixel data is outputted from the current source 240 of theoperating current supplying portion 24 thus set, and the AD conversionportion 250 of the column portion 26. Whenever the clock is inputted,the read-out signal is successively shift-registered, thereby carryingout the pixel reading (the horizontal transfer of the pixel data). Inaddition, after the reading of the cut-out portion of the pixels hasbeen ended, the logic is obtained with the scanning end signal (thetrigger signal representing the end of the scanning), and the outputfrom the horizontal read control pulse HSEL is stopped (for example,reset), thereby making it possible to skip the pixels in and after thattime (not to read out the pixel data).

When the concept of the address is added in the horizontal direction asdescribed above, both of the start address and the end address of thepixel cut-out portion are set in the control for the horizontal readcontrol pulse HSEL, thereby making it possible to carry out the skipping(to start to output the horizontal read control pulse HSEL from thespecified address).

[Technique for Generating Read Start Position Signal]

FIGS. 17A and 17B are respectively a circuit diagram and a timing chartexplaining a technique for generating a read start position signal.Here, FIG. 17A is a circuit diagram showing a configuration of a readstart position signal generating portion, and FIG. 17B is a timing chartexplaining an operation of the read start position signal generatingportion.

The read start position signal generating portion 580 includes a D typeflip flop 582, an inverter 583, a 2-input type AND gate 584, a 2-inputtype selector 586, and a D type flip flop 588 every column (in a word,every column portion 23). In a phase of start of the operation (forexample, in a phase of start of the vertical scanning), a reset signalis supplied to each of reset terminals RST of the flip flops 582 and 588to reset the non-inverted output signal Q to the L level. In the flipflop 582, the column stop signal CLMSTP outputted from the OR gate 522shown in FIG. 7 is inputted to a data input terminal D, and a horizontaltransfer clock CK_H is supplied to a clock input terminal. In the ANDgate 584, a signal obtained by inverting the column stop signal CLMSTPin logic in the inverter 583 is inputted to one input terminal, and anon-inverted output signal Q from the flip flop 582 is inputted to theother input terminal. The selector 586 and the flip flop 588 have aconfiguration of fetching in and holding an original read start positionsignal ST only when the horizontal read control pulse HSEL_(n) isinputted thereto. In the selector 586, the output signal (the originalread start position signal ST) from the AND gate 584 is inputted to oneinput terminal (a “1” side), and the non-inverted output signal Q fromthe flip flop 588 is inputted to the other input terminal (a “0” side).The horizontal read control pulse HSEL_(n) is supplied to a controlinput terminal of the selector 586. When the horizontal read controlpulse HSEL_(n) is active (at the “1” (H) level in this case), theselector 585 selects and outputs the input signal on the “1” side. Onthe other hand, when the horizontal read control pulse HSEL_(n) isinactive (at the “0” (L) level in this case), the selector 585 selectsand outputs the input signal on the “0” side. In each of the flip flops588, an output signal from the selector 586 is inputted to a data inputterminal D, and the horizontal transfer clock CK_H is supplied to aclock input terminal.

With such a configuration, as shown in FIG. 17B, the edge detection iscarried out in the AND gate 584 by using both of the column stop signalCLMSTP and the signal obtained by latching the column stop signal CLMSTPin the flip flop 582, thereby generating the original read startposition signal ST representing the read start position. The originalread start position signal ST is latched in the flip flop 588synchronously with the horizontal transfer clock CK_H, therebygenerating and holding a read start position signal ST_(n) for eachcolumn. As a result, the read start position signal ST_(n) as shown inFIG. 17B is outputted from the non-inverting output terminal Q of theflip flop 588. By the way, since the read start position signal ST_(n),for example, is supposed to be created during the V blanking timeperiod, it may be impossible to carry out the skipping operation for oneline during the V blanking time period. However, the image within thecut-out range can be skipped, thereby outputting the pixel data.

[Relationship with Column AD Conversion Processing]

FIG. 18 is a diagram explaining a relationship between the function stopof each non-selection column and the column AD conversion processing.The function of the column circuit (the load MOS transistor composingthe constant current source 242 of the operating current supplyingportion 24, and the AD conversion portion 250) belonging to eachnon-selection column (other than the cut-out pixels in this case) iscontrolled, thereby making it possible to reduce the power consumptionin the phase of the pixel reading. Also, the function of stopping thehorizontal transfer of the pixel data of each non-selection column(skipping the pixels), thereby making it possible to shorten thehorizontal cutting-out time period. However, as shown in FIG. 18, theshortening of the horizontal scanning time period for one line to beread out is limited by a time period required for the column ADconversion processing (reference signal comparison type AD conversionprocessing). Therefore, there is a limit that the shortening of the timeperiod beyond the necessary time period is impossible. In other words,the horizontal skipping of each non-selection column can be carried outmerely up to the length of the time period required for the column ADconversion processing.

For example, a column ADC time period 1 shown in FIG. 18 is providedwhen the time period required for the column AD conversion processing islonger than that of the cut-out portion. In this case, the skippablerange does not contain the entire range out of the cut-out range, and islimited to a part thereof. Therefore, the actual skipping processing inthe horizontal thinning-out processing is limited to this part (=thisskippable range). On the other hand, a column ADC time period 2 shown inFIG. 18 is provided when the time period required for the column ADconversion processing is shorter than that of the cut-out portion. Inthis case, the skippable range contains the entire range out of thecut-out range. Therefore, the actual skipping processing in thehorizontal thinning-out processing is executed on the entire range outof the cut-out range.

5. Examples of Concrete Configurations

Hereinafter, a description will be given with respect to Examples ofconcrete configurations with each of which the horizontal skippingprocessing in still another embodiment described above is executed.

Example 1 Configuration of Horizontal Transferring Portion

FIG. 19 is a circuit diagram showing a schematic configuration of thehorizontal transferring portion 11 of Example 1, and FIG. 18 is acircuit diagram showing a detailed configuration of the horizontaltransferring portion 11 of Example 1. In these figures, the horizontaltransferring portion 11 is shown as a form in which the left-hand sidein the figures becomes a reading head side.

Horizontal skipping processing in Example 1, similarly to the case ofExample 2 which will be described later, is an application example ofthe horizontal skipping processing in the case where the horizontaltransferring portion 11 includes a shift register, and whenever theclock for horizontal transfer (the horizontal transfer clock CK_H) isinputted, the read-out signal (pixel data) is successively shifted tothe subsequent stage, thereby horizontally reading the pixel data (in aword, horizontally transferring the pixel data). Specifically, thehorizontal transferring portion 11 of Example 1 includes a shiftregister 610 in which registers 612 are cascade-connected to oneanother, and the pixel data is successively shifted to the subsequentstage. A shift register having a form in which parallel datasimultaneously fetched in from the AD conversion portions 250 belongingto the respective columns of the column portion 26 is outputted asserial data to the outputting portion 28 side (a so-called shiftregister for parallel input/serial output: a parallel/serial counter) isused as the shift register 610 in Example 1. In the shift register 610,serial output terminals SO of the registers 612 in the stages areconnected to serial input terminals SI of the registers 612 in thesubsequent stages, respectively, and parallel input terminals (datainput terminals DI of the registers 612) are connected to (countingportions 254 of) the AD conversion portions 250 of the columns,respectively. In addition, in (each of the registers 612 of) the shiftregister 610, the clock for horizontal transfer (the horizontal transferclock CK_H) is inputted to a clock input terminal CK, a mode controlsignal SL used to switch a shift mode and a load mode over to each otheris inputted to a mode setting terminal SL, and a clear signal CL isinputted to a clear terminal CL (reset terminal). A serial outputterminal SOUT in terms of the entire shift register 610 is connected tothe outputting portion 28. The horizontal transfer clock CK_H, the modecontrol signal SL, and the clear signal CL are all supplied from thecommunication/timing controlling portion 20.

In the phase of start of the horizontal scanning, firstly, the data heldin the registers 612 is reset by the clear signal CL. After that, themode control signal SL comes to indicate the load mode, whereby the datain the counting portions 254 of the column portion 26 is fetched in theregister 612. After that, when the mode control signal SL comes toindicate the shift mode, whenever the horizontal transfer clock CK_H isinputted, the pixel data (read-out signals) fetched in the register 612is successively shifted to the subsequent stage, thereby horizontallyreading out the pixel data (horizontally transferring the pixel data).Since the register 612 exhibits the latch function of holding thereinthe count results held in the counting portions 254, the register 612can respond to a so-called pipeline operation for executing the ADconversion processing in the AD conversion portion 250, and thehorizontal transfer of the pixel data in parallel with each other.

Here, in Example 1, even in carrying out the cutting-out and reading-outnot only in the phase of the normal horizontal transfer, the pixel datais transferred from the head side to the outputting portion 28. For thisreason, in the horizontal skipping processing in Example 1, it may beimpossible to skip the head side of the shift register (in a word, thepixel data in and before the cutting-out start), but it is possible toskip the pixel data in and after the cutting-out end. In a word, whenthe pixel data of the column of the cutting-out end is outputted fromthe read buffer (the reading-out of the pixel for the cut-out portion isended), the supply of the horizontal transfer clock CK_H is stopped tostop the horizontal transfer, thereby making it possible to skip (not toread out) the pixel data in and after that time.

Example 2

FIG. 20 is a circuit diagram, partly in block, explaining horizontalskipping processing in Example 2. In the figure, the horizontaltransferring portion 11 is shown as a form in which the left-hand sidein the figure becomes a reading head side. Example 2 is a change inhorizontal transfer of Example 1, and the operation stop control foreach non-selection column may be the same as that of Example 1.

The horizontal skipping processing in Example 2, similarly to the caseof Example 1, is an application example of the horizontal skippingprocessing in the case where the horizontal transferring portion 11includes a shift register, and whenever the clock for horizontaltransfer (the horizontal transfer clock CK_H) is inputted, the read-outsignal (pixel data) is successively shifted to the subsequent stage,thereby horizontally reading the pixel data (in a word, horizontallytransferring the pixel data). The horizontal skipping processing inExample 2 is different from that in Example 1 in that an output selectoris provided on the head side of the shift register, whereby it is easilyrealized to skip the pixel data before the cutting out-start.

Specifically, in the shift register 610, with regard to the registers612 in a range (a range indicated by ADJ in the figure) capable ofbecoming the non-selection column on the head side in the phase of thehorizontal skipping processing, output buffers 614 are provided in theserial output terminals SO, respectively. Serial output terminals SO ofthe output buffer 614 are connected commonly to a serial output terminalSOUT in terms of the entire shift register 610. Control signals (readingbuffer indicating signals Hrd_k: a reference character k is a columnnumber from the final stage side) indicating which of the output signalsfrom the output buffers 614 is supplied to the outputting portion 28, inother words, which of the output buffers 612 is used as the readingbuffer are individually supplied from a read column control signalgenerating portion 690 to the output buffers 614. The read columncontrol signal generating portion 690 includes a read buffer positiondetermining portion 694. A cutting-out start address indicating signalis supplied from the communication/timing controlling portion 20 to theread buffer position determining portion 694. The read buffer positiondetermining portion 694 specifies the column of the read buffers basedon the cutting-out start address indicating signal, and generates theread buffer indicating signals Hrd_k of which only the read bufferindicating signals having the column number of the read buffers areactive (for example, at the H level), and other read buffer indicatingsignals are inactive (for example, at the L level). In the outputbuffers 614 for which the read buffer indicating signals Hrd_k areinactive, the serial output terminals SO thereof becomes ahigh-impedance state. On the other hand, the output buffers 614 (readbuffers) for which the read buffer indicating signals Hrd_k are activesuccessively transfer the pixel data from the serial output terminalSOUT to the outputting portion 28.

In Example 1, even in carrying out the cutting-out and reading-out notonly in the phase of the normal horizontal transfer, the pixel data istransferred from the head side to the outputting portion 28. On theother hand, when the cutting-out and the reading-out are carried out inExample 2, the pixel data is transferred from the read buffers to theoutputting portion 28. As a result, the pixel data of the non-selectioncolumn on the head side is not horizontally transferred, but the pixeldata of the selection columns from the read start position issuccessively, horizontally transferred. Also, when the pixel data of thecolumn in the cutting-out end is outputted from the read buffers, in aword, when the reading for the cut-out portion of the pixels is ended,similarly to the case of Example 1, the horizontal transfer is stopped,thereby making it possible to skip (not to read out) the pixel data inand after that time. By the way, when the normal horizontal transfer iscarried out in Example 2, there is no inconvenience because the pixeldata is transferred from the head output buffer 614 (in a word, the readregister 612) to the outputting portion 28.

Example 3

FIG. 21 is a circuit diagram, partly in block, explaining horizontalskipping processing in Example 3. In these figure, the horizontaltransferring portion 11 is shown as a form in which the left-hand sidein the figure becomes a reading head side. Example 3 is a change inhorizontal transfer of Example 1, and the operation stop control foreach non-selection column may be the same as that of Example 1.

Unlike both of Example 1 and Example 2, the feature of the horizontalskipping processing in Example 3 is that the pixel data (read out) isnot successively transferred to the subsequent stage by the shiftregister whenever the horizontal transfer clock CK_H is inputted, butthe read start position and end position in the horizontal direction areregulated in accordance with control made by the horizontal scanningportion 12, and the horizontal scanning position is successivelyshifted. In a word, when the horizontal transfer of the pixel data iscarried out, the horizontal read control pulse HSEL is outputted withone pixel as a unit, thereby controlling the reading-out timing of thepixel data. Also, with regard to the control for the horizontalskipping, the horizontal read control pulse HSEL starts to be outputtedfrom the position corresponding to the cutting-out start, therebyskipping (not reading out) the pixel data before the cutting-out start.For example, when the reading-out start position is set, the pixel datais outputted from the AD conversion portion 250 in the horizontalposition thus set. Thus, whenever the horizontal transfer clock CK_H isinputted, the horizontal read control pulse HSEL (assumed to be at theactive H level) is shifted, thereby shifting the horizontal readposition (in a word, the scanning start from the read start position byusing the horizontal read control pulse HSEL). As a result, thehorizontal transfer of the pixel data is carried out. When the readingfor the cut-out portion has been ended, the output of the horizontalread control pulse HSEL is stopped, thereby skipping (not reading out)the pixel data in and after that time.

For example, the horizontal transferring portion 11 includes both of thehorizontal scanning portion 12 (column scanning circuit) and thehorizontal signal line 18 for realizing the control circuit function forsuccessively reading out the signals in the pixel array portion 10 inthe horizontal direction. The horizontal scanning portion 12 indicatesthe column position of the data which is to be read out in the phase ofthe data transferring operation. Specifically, the horizontal scanningportion 12 includes a horizontal address setting portion 12 a and thehorizontal driving portion 12 b for controlling the column addresses andthe column scanning. In response to the control signal CN2 from thecommunication/timing controlling portion 20, the horizontal scanningportion 12 starts to scan the columns.

For example, the output terminals of the counting portion 254 can beconnected to the horizontal signal line 18 through the output side ofthe individual AD conversion portions 250. Or, a configuration may beadopted in which the data memory portion 256 as a memory deviceincluding the latch for holding the count results held in the countingportion 254 is provided in the subsequent stage of the counting portion254, thereby responding to the pipeline processing. The data memoryportion 256 holds and stores therein the count data outputted from thecounting portion 254 at a determined timing. Hereinafter, a descriptionwill be given with respect to the case of the data memory portion 256 isprovided.

The horizontal scanning portion 12 has a function of a reading-outscanning portion for reading out the count values held in the datamemory portions 256, respectively, in parallel with that the comparingportion 252 and the counting portion 254 of the column portion 26execute the respective pieces of processing of which the comparingportion 252 and the counting portion 254 take charge.

Each of the data memory portions 256, for example, includes a D typeflip flop 652 and an output buffer 654. In the D type flip flop 652, adata input terminal D is connected to the output terminal of thecounting portion 254, and a non-inverting output terminal Q is connectedto an input terminal of the output buffer 654. An output terminal of theoutput buffer 654 is connected to the horizontal signal line 18. Thehorizontal read control pulse HSEL is supplied from (the horizontaldriving portion 12 b of) the horizontal scanning portion 12 to a clockinput terminal CK of the D type flip flop 652. The output buffer 654 isof a type capable of obtaining a high-impedance state in addition to L/H(the low level L and the high level H). Thus, while the horizontal readcontrol pulse HSEL is at the active H level, the output buffer 654outputs the non-inverted signal at the non-inverting output terminal Q(L/H) of the D type flip flop 652 as it is. On the other hand, while thehorizontal read control pulse HSEL is at the inactive L level, theoutput buffer 654 causes the output terminal to become thehigh-impedance state. As a result, only the pixel data of the columns ineach of which the horizontal read control pulse HSEL is at the active Hlevel is transmitted to the outputting portion 28 through the horizontalsignal line 18, thereby making it possible to realize the horizontaltransfer of the pixel data.

The horizontal signal line 18 has signal lines for either a bit width ora double bit width (for example, in the case of a complementary output)of the AD conversion portion 250, and is connected to the outputtingportion 28 having signal amplifiers 402 corresponding to the respectiveoutput lines. The counting portion 254, the data memory portion 256, andthe horizontal signal line 18 adopt the respective configurations eachcorresponding to N bits.

The horizontal scanning portion 12 includes a shift register 660 inwhich registers 662 (for example, D type flip flop) arecascade-connected to one another as the horizontal address settingportion 12 a. When a start pulse H_ST indicating the horizontal scanningstart is inputted to the horizontal scanning portion 12, the horizontalscanning portion 12 carries out a shifting operation for subsequentlysupplying the horizontal read control pulse HSEL corresponding to thestart pulse H_ST to the subsequent stage. For example, the start pulseH_ST is assumed to be a signal which is held in the H level only for atime period shorter than one cycle of the horizontal transfer clockCK_H, and whose H level can be latched at a rising edge of thehorizontal transfer clock CK_H. The register 662 latches the horizontalread control pulse HSEL (the start pulse HST in the case of the initialstage) transferred thereto from the preceding stage at a rising of thehorizontal transfer clock CK_H, and holds the horizontal read controlpulse HSEL at the falling of the horizontal transfer clock CK_H, therebytransferring the horizontal read control pulse HSEL to the subsequentstage. It is possible to transfer the horizontal read control pulse HSELhaving an active time period (H level) for one cycle of the horizontaltransfer clock CK_H corresponding to the start pulse H_ST incorrespondence to the cycle of the horizontal transfer clock CK_Hwithout depending on the duty of the horizontal transfer clock CK_H.With regard to the shifting operation for the horizontal read controlpulse HSEL (in a word, the horizontal transferring operation for thehorizontal read control pulse HSEL), for example, it is only necessaryto refer to Example 6 which will be described later.

Here, the horizontal scanning portion 12 in Example 3 includes a gatecircuit composing the horizontal driving portion 12 b between the outputterminal of the register 662 and the AD conversion portion 250(specifically, the data memory portion 256), and the read column controlsignal generating portion 690. In this case, the read column controlsignal generating portion 690 includes the cut-out control signalgenerating portion 696 for generating the cut-out control signal used tocontrol the gate circuit (in other words, to regulate the read column).When the horizontal read control pulse HSEL is at the active H level,and the H time period of the cut-out control signal used to regulate thecut-out range indicates the cut-out range (active time period), a2-input type AND gate 672, for example, is used as the gate circuit. Inthis connection, when the logic of the active time period of thehorizontal read control pulse HSEL or the cut-out control signal isdifferent from that of the AND gate 672, a circuit corresponding theretois also used as the gate circuit.

In the AND gate 672, the horizontal read control pulse HSEL outputtedfrom the register 662 is supplied to one input terminal, and the cut-outcontrol signal used to regulate the cut-out range is supplied from thecut-out control signal generating portion 696 to the other inputterminal. The cut-out control signal may be signals corresponding to thecolumns, respectively. Or, a signal obtained by logic-inverting thecolumn stop signal CLMSTP shown in FIG. 6 or FIG. 10 may also becommonly used. A signal obtained by latching the column stop signalCLMSTP shown in FIG. 7 can be used as the former. In a word, thecutting-out control signal generating portion 696 can utilize a part ofor all of the configuration of the column stop signal generating portionshown in FIG. 7.

In such Example 3, only for the time period for which the cutting-outcontrol signal is at the active H level, the pixel data is horizontallytransferred. In this connection, as shown in FIG. 14, or Example 1 andExample 2, when the read start position control for starting the outputof the horizontal read control pulse HSEL from the positioncorresponding to the cutting-out start is also carried out, it ispossible to skip (not read out) the pixel data of each non-selectioncolumn in and after the cutting-out start.

Example 4

FIGS. 22 to 24 are respectively circuit diagrams explaining horizontalskipping processing in Example 4. Here, FIG. 22 is a circuit diagramshowing a schematic configuration of the horizontal transferring portion11 in Example 4. FIGS. 23 and 24 are respectively circuit diagrams eachshowing a detailed configuration of the horizontal transferring portion11 in Example 4. As shown in FIG. 22, the horizontal transferringportion 11 in Example 4 includes a horizontal transfer controllingportion 640 containing therein a switch circuit 644 every column. A readstart position signal ST, is inputted from the read start positionsignal generating portion 580 to the switch circuit 644 _(n). Also, thehorizontal transfer control signal is supplied from thecommunication/timing controlling portion 20 to a control input terminalof the switch circuit 644 _(n). The column standby signal CLMSTB_(n) issupplied to the horizontal transfer controlling portion 640 _(n). Thehorizontal transfer controlling portion 640 _(n) successively transfersthe horizontal read control pulse HSEL to the subsequent stage, and alsosupplies the horizontal read control pulse HSEL to the data memoryportion 256 of the corresponding column. An output terminal of the datamemory portion 256 is connected to the horizontal signal line 18.Although not illustrated, similarly to the case of Example 3, the datamemory portion 256 includes a D type flip flop 652 and an output buffer654. While the horizontal read control pulse HSEL is at the active Hlevel, the data memory portion 256 outputs the data held therein to thehorizontal signal line 18. On the other hand, while the horizontal readcontrol pulse HSEL is at the inactive L level, the data memory portion256 causes the output terminal to become the high-impedance state.

As shown in FIGS. 23 and 24, the horizontal transfer controlling portion640 includes a D type flip flop 642 (register), and a switch circuit 644having 2-input type switches 645 and 646. The horizontal transfercontrol signal used to switch a direction (route) in which thehorizontal read control pulse HSEL is transferred to the next shiftregister over to another one is supplied to a control input terminal (ofthe switch 645) of the switch circuit 644.

In the switch 645 _(n), the horizontal read control pulse HSEL_(n−1)outputted thereto from the flip flop 642 _(n−1) in the preceding stageis inputted to one input terminal (a “0” side). Also, the horizontalread control pulse HSEL_(n+1) outputted thereto from the flip flop 642_(n−1) in the subsequent stage is inputted to the other input terminal(a “1” side). It is noted that both of one input terminal (the “0” side)of the switch 645 ₀ on the initial stage, and the other input terminal(the “1” side) of the switch 645 _(H) in the final stage are fixedeither to the L level or to the H level. The switch 645 _(n) selects andoutputs the input signal on the “0” side when the horizontal transfercontrol signal is at “0: the L level,” and selects and outputs the inputsignal on the “1” side when the horizontal transfer control signal is at“1: the H level.” For example, in the case of the non-inversion reading,the switching is made to “0: the L level” side, and in the phase of theinversion, the switching is made to “1: H level” side. In the switch 646_(n), the output signal from the switch 645 _(n) is inputted to oneinput terminal (the “0” side), the read start position signal, n,corresponding to the read start position signal ST_(n) is inputted tothe other input terminal (the “1” side), and the horizontal scanningstart pulse corresponding to the horizontal synchronous signal isinputted to a control input terminal. In this connection, FIG. 23 showsa state when the horizontal scanning start pulse is at the H level, andFIG. 24 shows a state when the horizontal scanning start pulse is at theL level. In the flip flop 642 _(n), the output signal from the switch646 _(n) is inputted to a D input terminal, the horizontal transferclock CK_H is supplied to a clock input terminal, the column standbysignal CLMSTB_(n) is supplied to a reset terminal RST, and thehorizontal read control pulse HSEL_(n) is outputted from a non-invertingoutput terminal Q.

In such a configuration, the switch 646 _(n) carries out the switchingto the side on which the read start position signal, n, (cut-out signal)is fetched in by only one cycle of the horizontal transfer signal (whenthe horizontal synchronous signal is inputted) based on the horizontalscanning start pulse. As a result, the transfer of the horizontal readcontrol pulse HSEL_(n) starts from the column for which the read startposition signal, n, is at the H level. Specifically, firstly, as shownin FIG. 23, while the horizontal scanning state pulse (horizontalsynchronous signal) is at the H level, the switch 646 _(n) is switchedto the “1” side to select the read start position signal, n, therebysupplying the read start position signal, n, to the D input terminal ofthe flip flop 642 _(n). The flip flop 642 _(n) fetches therein the readstart position signal, n, (the signal for which only the column in thestart position is at the H level) synchronously with the horizontaltransfer clock CK_H, and holds therein the read start position signal,n, as the horizontal read control pulse HSEL_(n). As shown in FIG. 24,when the horizontal scanning start signal becomes the L level (after alapse of one cycle of the horizontal transfer clock CK_H), whenever thehorizontal transfer clock CK_H is inputted, the horizontal read controlpulse HSEL_(n) is shift-registered. As a result, since the horizontalread control pulse HSEL_(n) becomes the H level in order from the startposition, the pixel data in the data memory portion 256 of thecorresponding column is selected in order to be transferred through thehorizontal signal line 18. In a word, the switch 646 _(n) of the columnfor which the read start position signal n is at the H level, and thereading starts from that column through the shifting operation. As aresult, the pixel data before the cutting-out start can be skipped. Thehorizontal read control pulse HSEL_(n) is shift-registered from the readstart position, thereby providing the configuration carrying out theskipping. In this connection, the flip flop 642 _(n) of the pixel columnnot to be read out is reset by using the column standby signalCLMSTB_(n), thereby stopping the operation.

Horizontal Thinning-Out Processing Example 5

FIGS. 25 and 26 are respectively circuit diagrams explaining skippingprocessing of Example 5. Example 5 is a change in horizontal transfer ofExample 1, and the operation stop control for each non-selection columnmay be the same as that of Example 1.

Unlike Example 1 to Example 4 as the application examples of thehorizontal cutting-out processing, the horizontal skipping processing ofExample 5 is an application example of the horizontal thinning-outprocessing. Thus, the horizontal skipping processing of Example 5features that the measures are taken so as to be applied to thehorizontal thinning-out processing on the basis of a configuration inwhich whenever the horizontal transfer clock CK_H is inputted, the pixeldata (read-out signal) is successively transferred to the subsequentstage by using the shift register, (this point is identical either toExample 1 or to Example 2). In this connection, the horizontalthinning-out processing is a form in which the pixel data is transferredto the horizontal signal line 18 side every number, m, of columns (m isthe number of thinning-out and is a positive integer equal to or largerthan 2). Thus, hereinafter, we shall refer the horizontal thinning-outprocessing as 1/m thinning. Although a detailed description is omittedhere, it is better for the operating current supplying portion 24 andthe column portion 26 to stop the operation for each non-selectioncolumn not becoming a read-out object, thereby reducing the powerconsumption.

In a first case shown in FIG. 25, the horizontal transferring portion 11includes a switch portion 620 having a selector 622 for responding tothe horizontal thinning-out processing between each adjacent tworegisters 612 (in a word, between each adjacent two stages) of the shiftregister 610 so as to be capable of responding to the 1/m thinning (m:an arbitrary thinning-out number). The selector 622 uses m inputs-1output type switch so as to be capable of responding to the 1/mthinning.

For the sake of drawing, the connection of the signal lines to the inputterminals of the selectors 622 _(n) is omitted in the entire figure forillustration. However, as shown in special note in the figure, in theselector 622 _(n) disposed on the input side of the register 612 _(n) onthe n-th stage, an output terminal OUT is connected to an input side ofthe register 612 _(n), a first input terminal IN₁ is connected to anoutput terminal of the register 612 _(n−1) (in a word, the (n−1)-thstage) right before the register 612 _(n−2), and a second input terminalIN₂ is connected to an output terminal of the register 612 _(n−2) (in aword, the (n−2)-th stage) right before the register 612 _(n−1).Likewise, a final m-th input terminal IN_(m) is connected to an outputterminal of the register 612 _(n−m) in the (n−m)-th stage. In theselector 622 _(n−1) disposed on the input side of the register 612_(n−1) in the (n−1)-th stage, an output terminal OUT is connected to aninput side of the register 612 _(n−1), a first input terminal TN₁ isconnected to an output terminal of the register 612 _(n−2) (in a word,in the (n−2)-th stage) right before the register 612 _(n−1), and asecond input terminal IN₂ is connected to an output terminal of theregister 612 _(n−3) (in a word, in the (n−3)-th stage) right before theregister 612 _(n−2). Likewise, a final m-th input terminal IN_(m) isconnected to an output terminal of the register 612 _(n−m−1) in the(n−m−1)-th stage. This also applies to any other stage.

In the selectors 622, a control signal M used to control the number, m,of thinning is inputted from the communication/timing controllingportion 20 to a control input terminal. Thus, the selectors 622 arecontrolled in such a way that in a phase of ½ thinning, the second inputterminal IN₂ is selected. Likewise, the selectors 622 are controlled insuch a way that in a phase of 1/m thinning, the m-th input terminalIN_(m) is selected. As a result, since only the output from the register612 in an (n±m·α)-th stage (α: an arbitrary integer) is selectivelytransferred to the outputting portion 28 side, the pixel data can betransferred to the horizontal signal line 18 side every number, m, ofthinning. In this connection, there is no inconvenience in the phase ofthe normal reading-out processing because the control is carried out soas to select the first input terminal IN₁.

A second case shown in FIG. 26 is the case where the number, m, ofthinning may be fixed, and a 2 inputs-1 output type switch is used everynumber, m, of thinning. In the selector 622 _(n) disposed on the inputside of the register 612 _(n) in the n-th stage, the output terminal OUTis connected to the input side of the register 612 _(n), the first inputterminal IN₁ is connected to the output terminal of the register 612_(n−1) (in a word, in the (n−1)-th stage) right before the register 612_(n), and the second input terminal IN₂ is connected to the outputterminal of the register 612 _(n−m) in the (n−m)-th stage. This alsoapplies to other (n±m·α)-th stage (α: arbitrary integer).

A control signal used to control whether or not the horizontalthinning-out processing is executed is inputted to the control inputterminal of the selector 622. In the phase of the 1/m thinning, thecontrol is carried out so as to select the second input terminal IN₂. Asa result, since only the output from the register 612 in the (n±m·α)-thstage (α: an arbitrary integer) is selectively transferred to theoutputting portion 28 side, the pixel data can be transferred to thehorizontal signal line 18 side every number, m, of thinning. In thisconnection, there is no inconvenience in the phase of the normalreading-out processing because the control is carried out so as toselect the first input terminal IN₁.

It is noted that in any of the first case and the second case, withregard to the head side (the outputting portion 28 side) of the shiftregister 610, for example, it is better to cause the n-th stage (or anarbitrary (n±m·α)-th stage) to become the final stage (in a word, theread buffer) in order to prevent any of unnecessary columns from beingcaused. When the n-th stage is not caused to become the final stage, itis better to adopt a configuration in which any of unnecessary columnsis skipped. This way of thinking is the same as that in Example 2. Thatis to say, in the shift register 610, in the phase of the horizontalthinning-out processing, with regard to the register 612 in the rangecapable of becoming the non-selection column on the head side (forexample, the range from the n-th stage to the (n+m−1)-th stage), theoutput buffer 680 is provided on the output side. The output terminalsof the output buffers 680 are connected commonly to the serial outputterminal SOUT in terms of the entire shift register 610. Control signalsM_j indicating the number, m, of thinning are supplied from the readcolumn control signal generating portion 690 to the output buffers 680,respectively. The read column control signal generating portion 690includes a read buffer position determining portion 697. A controlsignal M used to control the number, m, of thinning is supplied from thecommunication/timing controlling portion 20 to the read buffer positiondetermining portion 697. The read buffer position determining portion697 generates control signals M_j (equivalent to the read bufferindicating signals Hrd_k) which specify the column of the read bufferbased on the control signal H, and of which only the control signalsindicating signals having the column number of the read buffers areactive (for example, at the H level), and other read buffer indicatingsignals are inactive (for example, at the L level). Of the controlsignals M_j, only the control signal of the n-th stage is active (forexample, at the H level), and other control signals are each inactive(for example, at the L level). The output terminal of each output bufferfor which the control signal M_j is inactive becomes the high-impedancestate. On the other hand, each output buffer (read buffer) for which thecontrol signal M_j is active transfers the output signal thereof to theoutputting portion 28. As a result, the pixel data in the non-selectioncolumn on the head side is not horizontally transferred. In thisconnection, when the normal control horizontal transfer is carried out,there is no inconvenience because the pixel data is transferred from thehead output buffer to the outputting portion 28.

Example 6

FIG. 27, and FIGS. 28A and 28B are respectively a circuit diagram, andtiming charts explaining horizontal skipping processing of Example 6.Here, FIG. 27 is a circuit diagram explaining a configuration of thehorizontal transferring portion 11 in Example 6. FIGS. 28A and 28B arerespectively timing charts explaining an operation of the horizontaltransferring portion 11 in Example 6. Example 6 is a change, in thehorizontal transfer, of Example 1, and the operation stop control foreach non-selection column may be the same as that in Example 1.

The horizontal skipping processing of Example 6 is an applicationexample of the horizontal thinning processing similarly to the case ofExample 3. Thus, Example 6 features that the measures are taken so as tobe applied to the horizontal thinning processing in accordance with thecontrol made by the horizontal scanning portion 12 (this point isidentical to that in Example 3). The basic configuration is the same asthat in Example 3, and thus Example 6 is different from Example 3 onlyin the control signals for the gate circuit 670. Specifically, thehorizontal scanning portion 12 in Example 6 includes a gate circuitcomposing the horizontal driving portion 12 b between the outputterminal of the register 662 and the AD conversion portion 250(specifically, the data memory portion 256). Also, the horizontalscanning portion 12 in Example 6 includes a read column control signalgenerating portion 690 having a thinning control signal generatingportion 698 for generating thinning control signals used to control thegate circuits (in a word, to regulate the read column).

In the AND gate 672, the horizontal read control pulse HSEL outputtedfrom the register 662 is supplied to one input terminal, and a thinningcontrol signal used to regulate the thinning portion is supplied fromthe thinning control signal generating portion 698 to the other inputterminal. The thinning control signal is a signal with which only thethinning position (the read column of the pixel data) becomes the activeH level. As a result, since only the output signal from the data memoryportion 256 in the (n±m·α)-th stage (α: an arbitrary integer) isselectively transferred to the outputting portion 28 side through thehorizontal signal line 18, the pixel data can be transferred to thehorizontal signal line 18 side every number, m, of thinning. In thisconnection, there is no inconvenience in the phase of the normalreading-out processing because the control is carried out in such a waythat the thinning control signals for all of the columns become theactive H level. Although a detailed description is omitted here, it isbetter for the operating current supplying portion 24 and the columnportion 26 to stop the operation for each non-selection column notbecoming a read-out object, thereby reducing the power consumption.

For example, a first case shown in FIG. 28A is an operation example inthe case of a signal in which an H level time period of the start pulseH_ST is shorter than one cycle of the horizontal transfer clock CK_H,and the H level can be latched at the rising edge of the horizontalclock CK_H, and is shown as an example of the ½ thinning. In FIG. 28A,only the pixel data of even-numbered (including 0-th) columns isselectively transferred to the outputting portion 28 through thehorizontal signal line 18. While the even-numbered (including 0-th)columns are selected, the pixel data is not transferred.

On the other hand, a second case shown in FIG. 28B is an operationexample in the case of a signal in which an H level time period of thestart pulse H_ST in the phase of the 1/m thinning is longer than a “m−1”cycles of the horizontal transfer clock CK_H and shorter than m cycles,and the H level can be latched at the rising edge of the horizontalclock CK_H, and is shown as an example of the ½ thinning (m=2). Thestart pulse H_ST in the normal operation is the same as that in thefirst case. In this case, the register 662 latches the horizontal readcontrol pulse HSEL (the start pulse H_ST in the case of the initialstage) supplied thereto from the preceding stage at a rising of thehorizontal transfer clock CK_H, and holds the horizontal read controlpulse HSEL at the falling of the horizontal transfer clock CK_H, therebytransferring the horizontal read control pulse HSEL to the subsequentstage. It is possible to transfer the horizontal read control pulse HSELhaving an active time period (H level) for the m cycles of thehorizontal transfer clock CK_H corresponding to the start pulse H_ST incorrespondence to the period of the horizontal transfer clock CK_Hwithout depending on the duty of the horizontal transfer clock CK_H.

In FIG. 28B, only the pixel data of the even-numbered (including 0-th)columns is selectively transferred to the outputting portion 28 throughthe horizontal signal line 18. While the even-numbered (including 0-th)columns are selected, the pixel data is not transferred. By the way,each of the horizontal read control pulses HSEL themselves outputtedfrom the respective registers 662 overlap the horizontal read controlpulses HSEL adjacent thereto by the “m−1” cycles of the horizontaltransfer clock CK_H. However, the signal used to control the 1/mthinning is outputted from the thinning control signal generatingportion 698 to be gated by the AND gate 672, thereby preventing theoverlap of the pixel data transferred on the horizontal signal line 18from being caused. In addition, when the cycle of the horizontaltransfer clock CK_H in the phase of the 1/m thinning is made 1/m (inother words, the clock rate is made m-fold), the read time can be made1/m of the normal phase.

Although the technique disclosed in this specification has beendescribed so far based on the embodiments, the technical scope disclosedin this specification is by no means limited to the scope of theembodiments described above. Various changes and modifications can beadded to the embodiments described above without departing from thesubject matter of the technique disclosed in this specification, andthus such embodiments obtained through the addition of such changes andmodifications are also contained in the technical scope of the techniquedisclosed in this specification. The embodiments described above by nomeans limit the technique concerned with the appended claims, and all ofcombinations of the features described in the embodiments describedabove are not necessarily essential to the solving means for theproblems on which the technique disclosed in this specification is made.The techniques in the various stages are contained in the embodimentsdescribed above and thus various techniques can be extracted based onsuitable combinations in plural constituent requirements disclosed. Evenwhen some constituent requirements are deleted from all of theconstituent requirements disclosed in the embodiments described above,the constitution remaining after deletion of some constituentrequirements are also extracted as the technique disclosed in thespecification as long as the effects corresponding to the problems onwhich the technique disclosed in this specification is made areobtained.

The present disclosure contains subject matter related to that disclosedin Japanese Priority Patent Application JP 2011-023782 filed in theJapan Patent Office on Feb. 7, 2011, the entire content of which ishereby incorporated by reference.

What is claimed is:
 1. A semiconductor device, comprising: a pixel arrayportion in which unit pixels are disposed in a matrix of columns androws, wherein vertical signal lines respectively correspond to columnsof the unit pixels to provide readout signals from the unit pixels inthe respective columns; an AD conversion portion including comparingunits and counter units, the comparing units being respectivelyconfigured to compare a reference signal and the readout signals fromthe respective columns, the counter units being configured to perform acount operation in a count operation effective period based oncomparison results of the comparing units from the respective columns,the AD conversion portion performing AD conversion processing foracquiring digital data of the readout signals on the basis of outputdata of the counter units; and an operating current supplying portion,including transistors corresponding to the respective columns, eachtransistor having a gate terminal, a first current terminal and a secondcurrent terminal, the first current terminal being connected to arespective vertical signal line at a node between the pixel arrayportion and the AD conversion portion, the second current terminal beingconnected to a reference current source, and the gate terminal beingconnected to a column stop control signal line, wherein powerconsumption is controlled to be lower in a pixel selection mode in whichonly information on a part of the unit pixels for one row in the pixelarray portion is required than in a normal operation mode.
 2. Thesemiconductor device according to claim 1, wherein each of the comparingunits of the AD conversion portion include an enable input, the enableinput being connected to the column stop control signal line that isconnected to the gate terminal of the transistor in its respectivecolumn.
 3. The semiconductor device according to claim 2, wherein eachof the counter units of the AD conversion portion include an input thatis connected to the column stop control signal line that is connected tothe gate terminal of the transistor in its respective column.
 4. Thesemiconductor device according to claim 1, wherein each of the counterunits of the AD conversion portion include an input that is connected tothe column stop control signal line that is connected to the gateterminal of the transistor in its respective column.
 5. Thesemiconductor device according to claim 1, wherein the power consumptionis controlled to be lower by disconnecting the AD conversion portionfrom a power source supply for a vertical signal line of a pixel unitwhose information is not required.
 6. A solid-state imaging apparatuscomprising an imaging lens and the semiconductor device according toclaim
 1. 7. The solid-state imaging apparatus according to claim 6,wherein each of the comparing units of the AD conversion portion includean enable input, the enable input being connected to the column stopcontrol signal line that is connected to the gate terminal of thetransistor in its respective column.
 8. The solid-state imagingapparatus according to claim 7, wherein each of the counter units of theAD conversion portion include an input that is connected to the columnstop control signal line that is connected to the gate terminal of thetransistor in its respective column.
 9. The solid-state imagingapparatus according to claim 6, wherein each of the counter units of theAD conversion portion include an input that is connected to the columnstop control signal line that is connected to the gate terminal of thetransistor in its respective column.
 10. The solid-state imagingapparatus according to claim 6, wherein the power consumption iscontrolled to be lower by disconnecting the AD conversion portion from apower source supply for a vertical signal line of a pixel unit whoseinformation is not required.